Invention Grant
US08342745B2 Method for passive determination of the operating temperature in a thermally highly loaded device, and apparatus for carrying out the method
有权
用于被动确定热负荷高的装置中的工作温度的方法,以及用于执行该方法的装置
- Patent Title: Method for passive determination of the operating temperature in a thermally highly loaded device, and apparatus for carrying out the method
- Patent Title (中): 用于被动确定热负荷高的装置中的工作温度的方法,以及用于执行该方法的装置
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Application No.: US12403918Application Date: 2009-03-13
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Publication No.: US08342745B2Publication Date: 2013-01-01
- Inventor: Roland Moser , Klaus Germerdonk , Bernd Rabensteiner , Peter Lang
- Applicant: Roland Moser , Klaus Germerdonk , Bernd Rabensteiner , Peter Lang
- Applicant Address: CH Baden
- Assignee: ALSTOM Technology Ltd
- Current Assignee: ALSTOM Technology Ltd
- Current Assignee Address: CH Baden
- Agency: Volpe and Koenig, P.C.
- Priority: CH1565/06 20061002
- Main IPC: G01K3/00
- IPC: G01K3/00 ; G01N25/00 ; G01D21/00 ; F01D25/00

Abstract:
A method is provided for determination of an operating temperature in a thermally highly loaded device. Multiple individual passive measurement elements, having a measurable physical parameter depending on a constant temperature set during heat treatment, are provided. The parameter is set differently for each of the different measurement elements which are combined to form an array. In a first measurement, values of the physical parameter for the array are determined before the array is subjected to the operating temperature. The array is subjected to the operating temperature in the device and in a second measurement, values are determined for all the measurement elements in the array. First and second measurement values of the physical parameter for each of the measurement elements are compared and the temperature of the heat treatment of that measurement element whose value of the physical parameter has changed the least is taken as the measured temperature.
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