Invention Grant
US08347201B2 Reading method of a memory device with embedded error-correcting code and memory device with embedded error-correcting code
有权
具有嵌入式纠错码的存储器件的读取方法和具有嵌入式纠错码的存储器件
- Patent Title: Reading method of a memory device with embedded error-correcting code and memory device with embedded error-correcting code
- Patent Title (中): 具有嵌入式纠错码的存储器件的读取方法和具有嵌入式纠错码的存储器件
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Application No.: US13047678Application Date: 2011-03-14
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Publication No.: US08347201B2Publication Date: 2013-01-01
- Inventor: Alessia Marelli , Valeria Intini , Roberto Ravasio , Rino Micheloni
- Applicant: Alessia Marelli , Valeria Intini , Roberto Ravasio , Rino Micheloni
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Knobbe, Martens, Olson & Bear LLP
- Priority: EP06425141 20060302
- Main IPC: G06F7/02
- IPC: G06F7/02 ; H03M13/00

Abstract:
A reading method for a memory device with error-correcting encoding envisages the steps of: carrying out a first reading of a plurality of memory locations (A0, A1, . . . , ALS-1) to generate a first recovered string (S1), and performing a first decoding attempt using the first recovered string (S1). When the first decoding attempt fails, the memory locations are read at least one second time, and at least one second recovered string (S2-SN) is generated. On the basis of a comparison between the first recovered string (S1) and the second recovered string (S2-SN), a modified string (SM) is generated, in which erasures (X) are located, and at least one second decoding attempt is carried out using the modified string (SM).
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