Invention Grant
- Patent Title: Film formation method for forming silicon-containing insulating film
- Patent Title (中): 用于形成含硅绝缘膜的成膜方法
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Application No.: US13040565Application Date: 2011-03-04
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Publication No.: US08357619B2Publication Date: 2013-01-22
- Inventor: Kazuhide Hasebe , Shigeru Nakajima , Jun Ogawa
- Applicant: Kazuhide Hasebe , Shigeru Nakajima , Jun Ogawa
- Applicant Address: JP Tokyo
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP Tokyo
- Agency: Smith, Gambrell & Russell, LLP
- Priority: JP2008-022279 20080201; JP2009-002550 20090108
- Main IPC: H01L21/00
- IPC: H01L21/00

Abstract:
A silicon-containing insulating film is formed on a target substrate by CVD, in a process field to be selectively supplied with a first process gas including di-iso-propylaminosilane gas and a second process gas including an oxidizing gas or nitriding gas. The film is formed by performing a plurality of times a cycle alternately including first and second steps. The first step performs supply of the first process gas, thereby forming an adsorption layer containing silicon on a surface of the target substrate. The second performs supply of the second process gas, thereby oxidizing or nitriding the adsorption layer on the surface of the target substrate. The second step includes an excitation period of supplying the second process gas to the process field while exciting the second process gas by an exciting mechanism.
Public/Granted literature
- US20110151679A1 FILM FORMATION METHOD FOR FORMING SILICON-CONTAINING INSULATING FILM Public/Granted day:2011-06-23
Information query
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