发明授权
- 专利标题: Apparatus for measuring magnetic field of microwave-assisted head
- 专利标题(中): 用于测量微波辅助头磁场的装置
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申请号: US12755803申请日: 2010-04-07
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公开(公告)号: US08358127B2公开(公告)日: 2013-01-22
- 发明人: Isamu Sato , Hiroshi Ikeda , Mikio Matsuzaki , Tetsuya Roppongi , Noboru Yamanaka , Tsutomu Aoyama
- 申请人: Isamu Sato , Hiroshi Ikeda , Mikio Matsuzaki , Tetsuya Roppongi , Noboru Yamanaka , Tsutomu Aoyama
- 申请人地址: JP Tokyo
- 专利权人: TDK Corporation
- 当前专利权人: TDK Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: Posz Law Group, PLC
- 主分类号: G01R33/02
- IPC分类号: G01R33/02
摘要:
A measuring circuit system in a magnetic field measuring apparatus of the invention has an amplifier and a band-pass filter connected in sequence on an output terminal side of the TMR element, the band-pass filter is a narrow-range band-pass filter such that a peak pass frequency of the filter that is a center is a basic frequency selected from a range of 10 to 40 GHz and a band width centered around the basic frequency is a narrow range of ±0.5 to ±4 GHz; and with the measuring circuit system, an SIN ratio (SNR) of 3 dB or greater is obtained, the SNR being defined by a ratio of an amplitude S of a high-frequency generated signal induced by the TMR element to a total noise N that is a sum of a head noise generated by the TMR element and a circuit noise generated by the amplifier. With such a configuration, an in-plane high-frequency magnetic field generated by a microwave-assisted magnetic head is reliably and precisely measured.
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