发明授权
- 专利标题: Method of inspecting a DNA chip and apparatus thereof
- 专利标题(中): 检查DNA芯片的方法及其装置
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申请号: US11709120申请日: 2007-02-22
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公开(公告)号: US08361784B2公开(公告)日: 2013-01-29
- 发明人: Yoshitada Oshida , Toshihiko Nakata , Tomoaki Sakata , Kenji Yasuda , Satoshi Takahashi
- 申请人: Yoshitada Oshida , Toshihiko Nakata , Tomoaki Sakata , Kenji Yasuda , Satoshi Takahashi
- 申请人地址: JP Tokyo
- 专利权人: Hitachi, Ltd.
- 当前专利权人: Hitachi, Ltd.
- 当前专利权人地址: JP Tokyo
- 代理机构: Antonelli, Terry, Stout & Kraus, LLP.
- 优先权: JP11-283826 19991005; JP2000-018002 20000125; JP2000-181847 20000616; JP2000-247896 20000809
- 主分类号: C12M1/34
- IPC分类号: C12M1/34 ; G01N21/64
摘要:
A DNA inspecting apparatus including driving means for relatively changing positions of the multi-spot lights and a position of the DNA chip so as to detect the fluorescent lights in such a manner that a desired area on the DNA chip is irradiated with the multi-spot lights, and a control system for determining and inspecting DNA information about the to-be-inspected DNA chip from fluorescent light intensities and fluorescent light positions of the desired area on the DNA chip, the fluorescent light intensities and the fluorescent light positions being detected by the driving means and the fluorescent light detecting means.
公开/授权文献
- US20070154938A1 Method of inspecting a DNA chip and apparatus thereof 公开/授权日:2007-07-05
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