发明授权
- 专利标题: Method for detecting impurities on a surface
- 专利标题(中): 检测表面杂质的方法
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申请号: US12444750申请日: 2007-09-11
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公开(公告)号: US08363213B2公开(公告)日: 2013-01-29
- 发明人: Eva Wagner , Thomas Brinz , Thomas Geiger , Jane Lewis , Markus Tiefenbacher , Tobias Burk , Sebastian Koltzenburg , Wolfgang Schrof
- 申请人: Eva Wagner , Thomas Brinz , Thomas Geiger , Jane Lewis , Markus Tiefenbacher , Tobias Burk , Sebastian Koltzenburg , Wolfgang Schrof
- 申请人地址: DE Stuttgart DE Ludwigshafen
- 专利权人: Robert Bosch GmbH,BASF AG
- 当前专利权人: Robert Bosch GmbH,BASF AG
- 当前专利权人地址: DE Stuttgart DE Ludwigshafen
- 代理机构: Kenyon & Kenyon LLP
- 优先权: DE102006051313 20061031
- 国际申请: PCT/EP2007/059526 WO 20070911
- 国际公布: WO2008/052836 WO 20080508
- 主分类号: G01N21/88
- IPC分类号: G01N21/88
摘要:
A method is provided for detecting not fully set coatings and liquid or smearing impurities on a surface, in which in a first step a film is pressed onto a surface of a coating using a predefined press-on pressure, the film having a relative motion with respect to the surface of the coating, thereafter the film is pulled off the surface of the coating and finally it is determined whether impurities are adhering to the film. A device is also provided for performing the method, including at least one film, which may be pressed against a surface to be tested, at least one press-on roller having a surface by which the film is pressed against the coating, and at least one device for determining whether there are impurities adhering to the film.
公开/授权文献
- US20100328676A1 METHOD FOR DETECTING IMPURITIES ON A SURFACE 公开/授权日:2010-12-30