Invention Grant
- Patent Title: Method for detecting impurities on a surface
- Patent Title (中): 检测表面杂质的方法
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Application No.: US12444750Application Date: 2007-09-11
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Publication No.: US08363213B2Publication Date: 2013-01-29
- Inventor: Eva Wagner , Thomas Brinz , Thomas Geiger , Jane Lewis , Markus Tiefenbacher , Tobias Burk , Sebastian Koltzenburg , Wolfgang Schrof
- Applicant: Eva Wagner , Thomas Brinz , Thomas Geiger , Jane Lewis , Markus Tiefenbacher , Tobias Burk , Sebastian Koltzenburg , Wolfgang Schrof
- Applicant Address: DE Stuttgart DE Ludwigshafen
- Assignee: Robert Bosch GmbH,BASF AG
- Current Assignee: Robert Bosch GmbH,BASF AG
- Current Assignee Address: DE Stuttgart DE Ludwigshafen
- Agency: Kenyon & Kenyon LLP
- Priority: DE102006051313 20061031
- International Application: PCT/EP2007/059526 WO 20070911
- International Announcement: WO2008/052836 WO 20080508
- Main IPC: G01N21/88
- IPC: G01N21/88

Abstract:
A method is provided for detecting not fully set coatings and liquid or smearing impurities on a surface, in which in a first step a film is pressed onto a surface of a coating using a predefined press-on pressure, the film having a relative motion with respect to the surface of the coating, thereafter the film is pulled off the surface of the coating and finally it is determined whether impurities are adhering to the film. A device is also provided for performing the method, including at least one film, which may be pressed against a surface to be tested, at least one press-on roller having a surface by which the film is pressed against the coating, and at least one device for determining whether there are impurities adhering to the film.
Public/Granted literature
- US20100328676A1 METHOD FOR DETECTING IMPURITIES ON A SURFACE Public/Granted day:2010-12-30
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