Invention Grant
- Patent Title: Method of fabricating a 3-D device
- Patent Title (中): 制造3-D器件的方法
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Application No.: US13070196Application Date: 2011-03-23
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Publication No.: US08367472B2Publication Date: 2013-02-05
- Inventor: Jong Ho Lee , Dong Ho Lee , Eun Chul Ahn , Yong Chai Kwon
- Applicant: Jong Ho Lee , Dong Ho Lee , Eun Chul Ahn , Yong Chai Kwon
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Lee & Morse, P.C.
- Priority: KR10-2007-0077507 20070801
- Main IPC: H01L21/60
- IPC: H01L21/60

Abstract:
A method of fabricating a semiconductor device includes providing a semiconductor substrate having an active surface, thinning the substrate by removing material from a second surface of the substrate opposite the active surface, bonding a metal carrier to the second surface of the thinned substrate, forming a via opening in the thinned substrate, forming a conductive member in the via opening, and patterning the metal carrier bonded to the second surface of the thinned substrate to form a metal pattern.
Public/Granted literature
- US20110171781A1 METHOD OF FABRICATING A 3-D DEVICE Public/Granted day:2011-07-14
Information query
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