发明授权
US08388854B2 Methods of forming nanodots using spacer patterning techniques and structures formed thereby
失效
使用间隔图案化技术和由此形成的结构形成纳米点的方法
- 专利标题: Methods of forming nanodots using spacer patterning techniques and structures formed thereby
- 专利标题(中): 使用间隔图案化技术和由此形成的结构形成纳米点的方法
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申请号: US11968091申请日: 2007-12-31
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公开(公告)号: US08388854B2公开(公告)日: 2013-03-05
- 发明人: Brian Doyle , Been-Yih Jin , Jack Kavalieros , Robert Chau
- 申请人: Brian Doyle , Been-Yih Jin , Jack Kavalieros , Robert Chau
- 申请人地址: US CA Santa Clara
- 专利权人: Intel Corporation
- 当前专利权人: Intel Corporation
- 当前专利权人地址: US CA Santa Clara
- 代理机构: Forefront IP Lawgroup, PLLC
- 主分类号: C23F1/00
- IPC分类号: C23F1/00
摘要:
Methods and associated structures of forming a microelectronic device are described. Those methods may include forming a first block on a nanodot material, forming a first spacer on the first block, removing the first block to form a free standing spacer, removing exposed portions of the nanodot material and then the free standing spacer to form nanowires, forming a second block at an angle to a length of the nanowires, forming a second spacer on the second block, forming a second free standing spacer on the nanowires by removing the second block, and removing exposed portions of the nanowires and then the second free standing spacer to form an ordered array of nanodots.
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