发明授权
US08389348B2 Mechanism of forming SiC crystalline on Si substrates to allow integration of GaN and Si electronics
有权
在Si衬底上形成SiC晶体以允许GaN和Si电子器件集成的机理
- 专利标题: Mechanism of forming SiC crystalline on Si substrates to allow integration of GaN and Si electronics
- 专利标题(中): 在Si衬底上形成SiC晶体以允许GaN和Si电子器件集成的机理
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申请号: US12881505申请日: 2010-09-14
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公开(公告)号: US08389348B2公开(公告)日: 2013-03-05
- 发明人: Kong-Beng Thei , Jiun-Lei Jerry Yu , Chun Lin Tsai , Hsiao-Chin Tuan , Alex Kalnitsky
- 申请人: Kong-Beng Thei , Jiun-Lei Jerry Yu , Chun Lin Tsai , Hsiao-Chin Tuan , Alex Kalnitsky
- 申请人地址: TW
- 专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人地址: TW
- 代理机构: Lowe Hauptman Ham & Berner, LLP
- 主分类号: H01L21/338
- IPC分类号: H01L21/338
摘要:
The mechanisms of forming SiC crystalline regions on Si substrate described above enable formation and integration of GaN-based devices and Si-based devices on a same substrate. The SiC crystalline regions are formed by implanting carbon into regions of Si substrate and then annealing the substrate. An implant-stop layer is used to cover the Si device regions during formation of the SiC crystalline regions.
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