Invention Grant
- Patent Title: System and method for scanning of probe arrays
- Patent Title (中): 用于扫描探针阵列的系统和方法
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Application No.: US13480888Application Date: 2012-05-25
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Publication No.: US08391582B2Publication Date: 2013-03-05
- Inventor: Nathan K. Weiner , Patrick J. Odoy , Eric Schultz , Mark Jones , James T. Overbeck , Herman DeWeerd , David A. Stura , Albert K. Bukys , Tim J. Woolaver , Thomas P. Regan , David Bradbury , Eric E. McKenzie , Roger DiPaolo , Christopher Miles , Joel M. Katz , Oleinik-Ovod Ksenia
- Applicant: Nathan K. Weiner , Patrick J. Odoy , Eric Schultz , Mark Jones , James T. Overbeck , Herman DeWeerd , David A. Stura , Albert K. Bukys , Tim J. Woolaver , Thomas P. Regan , David Bradbury , Eric E. McKenzie , Roger DiPaolo , Christopher Miles , Joel M. Katz , Oleinik-Ovod Ksenia
- Applicant Address: US CA Santa Clara
- Assignee: Affymetrix, Inc.
- Current Assignee: Affymetrix, Inc.
- Current Assignee Address: US CA Santa Clara
- Agency: Affymetrix, Inc.
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
An embodiment of a scanning system is described including optical elements that direct an excitation beam at a probe array, detectors that receive reflected intensity data responsive to the excitation beam, where the reflected intensity data is responsive to a focusing distance between an optical element and the probe array, a transport frame that adjusts the focusing distance in a direction with respect to the probe array, an auto-focuser that determines a best plane of focus based upon characteristics of the reflected intensity data of at least two focusing distances where the detectors further receive pixel intensity values based upon detected emissions from a plurality of probe features disposed on the probe array at the best plane of focus, and an image generator that associates each of the pixel intensity values with at least one image pixel position of a probe array based upon one or more position correction values.
Public/Granted literature
- US20120235016A1 System, Method, and Product for Scanning of Biological Materials Public/Granted day:2012-09-20
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