发明授权
US08395930B2 Method of programming variable resistance element and nonvolatile storage device
有权
编程可变电阻元件和非易失性存储器件的方法
- 专利标题: Method of programming variable resistance element and nonvolatile storage device
- 专利标题(中): 编程可变电阻元件和非易失性存储器件的方法
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申请号: US13596154申请日: 2012-08-28
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公开(公告)号: US08395930B2公开(公告)日: 2013-03-12
- 发明人: Shunsaku Muraoka , Takeshi Takagi , Satoru Mitani , Koji Katayama
- 申请人: Shunsaku Muraoka , Takeshi Takagi , Satoru Mitani , Koji Katayama
- 申请人地址: JP Osaka
- 专利权人: Panasonic Corporation
- 当前专利权人: Panasonic Corporation
- 当前专利权人地址: JP Osaka
- 代理机构: Wenderoth, Lind & Ponack, LLP.
- 优先权: JP2009-073296 20090325
- 主分类号: G11C11/21
- IPC分类号: G11C11/21
摘要:
A method includes applying a first polarity writing voltage pulse to a metal oxide layer to change its resistance state from high to low into a write state, applying a second polarity erasing voltage pulse different from the first polarity to the metal oxide layer to change its resistance state from low to high into an erase state, and applying an initial voltage pulse having the second polarity to the metal oxide layer before first application of the writing voltage pulse, to change an initial resistance value of the metal oxide layer. R0>RH>RL and |V0|>|Ve|≧|Vw| are satisfied where R0, RL, and RH are the resistance values of the initial, write, and erase states, respectively, of the metal oxide layer, and V0, Vw, and Ve are voltage values of the initial, writing, and erasing voltage pulses, respectively.
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