发明授权
- 专利标题: Extreme ultraviolet light source apparatus
- 专利标题(中): 极紫外光源设备
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申请号: US12566170申请日: 2009-09-24
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公开(公告)号: US08399867B2公开(公告)日: 2013-03-19
- 发明人: Akira Endo , Shinji Nagai , Kouji Kakizaki , Osamu Wakabayashi , Yoshifumi Ueno
- 申请人: Akira Endo , Shinji Nagai , Kouji Kakizaki , Osamu Wakabayashi , Yoshifumi Ueno
- 申请人地址: JP Tokyo
- 专利权人: Gigaphoton Inc.
- 当前专利权人: Gigaphoton Inc.
- 当前专利权人地址: JP Tokyo
- 代理机构: McDermott Will & Emery LLP
- 优先权: JP2008-250311 20080929; JP2009-125155 20090525
- 主分类号: H04H1/04
- IPC分类号: H04H1/04
摘要:
An EUV light source apparatus in which contamination or damage of optical elements and other component elements by debris can be suppressed to realize longer lives of them. The EUV light source apparatus is an apparatus for radiating extreme ultraviolet light by generating plasma of a target material within a chamber, and includes: a first laser unit for applying a first laser beam to the target material to generate pre-plasma; a second laser unit for applying a second laser beam to the pre-plasma to generate a main plasma for radiating the extreme ultraviolet light; and a magnetic field generating unit for generating a magnetic field within the chamber to control a state of at least one of the pre-plasma and the main plasma.
公开/授权文献
- US20100078579A1 EXTREME ULTRAVIOLET LIGHT SOURCE APPARATUS 公开/授权日:2010-04-01
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