发明授权
- 专利标题: Method of manufacturing plasmon generator
- 专利标题(中): 等离子体发生器的制造方法
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申请号: US13353981申请日: 2012-01-19
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公开(公告)号: US08400884B1公开(公告)日: 2013-03-19
- 发明人: Hironori Araki , Yoshitaka Sasaki , Hiroyuki Ito , Kazuki Sato , Shigeki Tanemura , Yukinori Ikegawa
- 申请人: Hironori Araki , Yoshitaka Sasaki , Hiroyuki Ito , Kazuki Sato , Shigeki Tanemura , Yukinori Ikegawa
- 申请人地址: US CA Milpitas
- 专利权人: Headway Technologies, Inc.
- 当前专利权人: Headway Technologies, Inc.
- 当前专利权人地址: US CA Milpitas
- 代理机构: Oliff & Berridge, PLC
- 主分类号: G11B21/08
- IPC分类号: G11B21/08 ; G11B7/085
摘要:
A method of manufacturing a plasmon generator includes the steps of forming an accommodation part and forming the plasmon generator to be accommodated in the accommodation part. The step of forming the accommodation part includes the steps of: forming a dielectric layer having an upper surface; etching the dielectric layer by using an etching mask and thereby forming a groove in the dielectric layer; and forming a dielectric film in the groove. The groove has first and second sidewalls and a bottom. Each of the first and second sidewalls forms an angle in the range of 0° to 15° relative to the direction perpendicular to the upper surface of the dielectric layer. The dielectric film includes a first portion interposed between the first sidewall and the first side surface, and a second portion interposed between the second sidewall and the second side surface.
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