发明授权
US08402316B2 Method of testing computer, computer test apparatus and non-transitory computer-readable medium
失效
计算机，计算机测试仪器和非暂时性计算机可读介质测试方法
- 专利标题： Method of testing computer, computer test apparatus and non-transitory computer-readable medium
- 专利标题（中）： 计算机，计算机测试仪器和非暂时性计算机可读介质测试方法
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申请号： US13086012申请日： 2011-04-13
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公开(公告)号： US08402316B2公开(公告)日： 2013-03-19
- 发明人: Fumio Ichikawa , Tamoru Inoue
- 申请人： Fumio Ichikawa , Tamoru Inoue
- 申请人地址： JP Kawasaki
- 专利权人： Fujitsu Limited
- 当前专利权人： Fujitsu Limited
- 当前专利权人地址： JP Kawasaki
- 代理机构： Fujitsu Patent Center
- 优先权： JP2010-125148 20100531
- 主分类号： G06F11/00
- IPC分类号： G06F11/00
摘要：
A method of testing a computer, the method has designating a register as an input-only register having a setting of a value which does not cause an exception interruption with an execution of a specific type of instruction, generating a test instruction array having a plurality of instructions for a test, by assigning a register excluding the input-only register as an output destination of an execution result of each of the plurality of instructions, executing the plurality of instructions included in the generated test instruction array, and evaluating the execution results by the computer.
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