发明授权
- 专利标题: Set sampling controls instruction
- 专利标题(中): 设置采样控制指令
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申请号: US12901805申请日: 2010-10-11
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公开(公告)号: US08417837B2公开(公告)日: 2013-04-09
- 发明人: Jane H. Bartik , Lisa C. Heller , Damian L. Osisek , Donald W. Schmidt , Patrick M. West, Jr. , Phil C. Yeh
- 申请人: Jane H. Bartik , Lisa C. Heller , Damian L. Osisek , Donald W. Schmidt , Patrick M. West, Jr. , Phil C. Yeh
- 申请人地址: US NY Armonk
- 专利权人: International Business Machines Corporation
- 当前专利权人: International Business Machines Corporation
- 当前专利权人地址: US NY Armonk
- 代理机构: Heslin Rothenberg Farley & Mesiti P.C.
- 代理商 John E. Campbell; Blanche E. Schiller, Esq.
- 主分类号: G06F17/00
- IPC分类号: G06F17/00 ; G06F3/00 ; G06F5/00 ; G06F15/00 ; G06F15/76 ; G06F9/30 ; G06F9/40 ; G06F7/38 ; G06F9/00 ; G06F9/44
摘要:
A measurement sampling facility takes snapshots of the central processing unit (CPU) on which it is executing at specified sampling intervals to collect data relating to tasks executing on the CPU. The collected data is stored in a buffer, and at selected times, an interrupt is provided to remove data from the buffer to enable reuse thereof. The interrupt is not taken after each sample, but in sufficient time to remove the data and minimize data loss.
公开/授权文献
- US20110029758A1 CENTRAL PROCESSING UNIT MEASUREMENT FACILITY 公开/授权日:2011-02-03
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