发明授权
US08432554B2 Surface position detecting apparatus, exposure apparatus and device manufacturing method 有权
表面位置检测装置,曝光装置及装置的制造方法

  • 专利标题: Surface position detecting apparatus, exposure apparatus and device manufacturing method
  • 专利标题(中): 表面位置检测装置,曝光装置及装置的制造方法
  • 申请号: US12093713
    申请日: 2006-11-14
  • 公开(公告)号: US08432554B2
    公开(公告)日: 2013-04-30
  • 发明人: Yasuhiro Hidaka
  • 申请人: Yasuhiro Hidaka
  • 申请人地址: JP Tokyo
  • 专利权人: Nikon Corporation
  • 当前专利权人: Nikon Corporation
  • 当前专利权人地址: JP Tokyo
  • 代理机构: Oliff & Berridge, PLC
  • 优先权: JPP2005-329645 20051115; JPP2006-297486 20061101
  • 国际申请: PCT/JP2006/322595 WO 20061114
  • 国际公布: WO2007/058151 WO 20070524
  • 主分类号: G01B11/14
  • IPC分类号: G01B11/14
Surface position detecting apparatus, exposure apparatus and device manufacturing method
摘要:
A surface position detecting apparatus is arranged to be able to detect a surface position of a detection target surface with high accuracy, while restraining influence of a relative positional deviation between polarization components in a beam totally reflected on an internal reflection surface of a prism member, on detection of the surface position of the detection target surface. At least one of a light projection system and a light reception system is provided with a total reflection prism member (7; 8) having an internal reflection surface (7b, 7c; 8b, 8c) which totally reflects an incident beam. For restraining influence of the relative positional deviation between polarization components of the beam totally reflected on the internal reflection surface of the total reflection prism member, on the detection of the surface position of the detection target surface (Wa), a refractive index of an optical material forming the total reflection prism member and an angle of incidence of the incident beam to the internal reflection surface of the total reflection prism member are set so as to satisfy a predetermined relation.
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