Invention Grant
- Patent Title: Measuring electrical resistance
- Patent Title (中): 测量电阻
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Application No.: US12824652Application Date: 2010-06-28
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Publication No.: US08432759B2Publication Date: 2013-04-30
- Inventor: Kuoyuan Hsu , Po-Hung Chen , Jiann-Tseng Huang , Subramani Kengeri
- Applicant: Kuoyuan Hsu , Po-Hung Chen , Jiann-Tseng Huang , Subramani Kengeri
- Applicant Address: TW
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW
- Agency: Lowe Hauptman Ham & Berner, LLP
- Main IPC: G11C7/00
- IPC: G11C7/00 ; G11C17/18

Abstract:
A circuit having a first circuit configured to receive an input voltage and generate a first voltage that generates a first current flowing through a resistive device and a second voltage that generates a second current; a node electrically coupled to the resistive device and having a third voltage that generates a third current; and a second circuit configured to generate a fourth voltage having a logic state indicating a logic state of the resistive device.
Public/Granted literature
- US20100329055A1 MEASURING ELECTRICAL RESISTANCE Public/Granted day:2010-12-30
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