发明授权
- 专利标题: System and method for detecting particles with a semiconductor device
- 专利标题(中): 用半导体器件检测粒子的系统和方法
-
申请号: US12844888申请日: 2010-07-28
-
公开(公告)号: US08436289B1公开(公告)日: 2013-05-07
- 发明人: Timothy Z. Hossain , Patrick Mark Clopton , Christopher Michael Foster , Christopher F. Lyons , Clayton Fullwood , Greg Alan Goodwin , Dan E. Posey
- 申请人: Timothy Z. Hossain , Patrick Mark Clopton , Christopher Michael Foster , Christopher F. Lyons , Clayton Fullwood , Greg Alan Goodwin , Dan E. Posey
- 申请人地址: US CA Sunnyvale
- 专利权人: Spansion LLC
- 当前专利权人: Spansion LLC
- 当前专利权人地址: US CA Sunnyvale
- 代理机构: Sterne, Kessler, Goldstein & Fox P.L.L.C.
- 主分类号: H01L31/00
- IPC分类号: H01L31/00
摘要:
Systems and methods are described herein for detecting particles emitted by nuclear material. The systems comprise one or more semiconductor devices for detecting particles emitted from nuclear material. The semiconductor devices can comprise a charge storage element comprising several layers. A non-conductive charge storage layer enveloped on top and bottom by dielectric layers is mounted on a substrate. At least one top semiconductor layer can be placed on top of the top dielectric layer. A reactive material that reacts to particles, such as neutrons emitted from nuclear material, can be incorporated into the top semiconductor layer. When the reactive material reacts to a particle emitted from nuclear material, ions are generated that can alter the charge storage layer and enable detection of the particle.
信息查询
IPC分类: