Invention Grant
- Patent Title: Measurement apparatus
- Patent Title (中): 测量装置
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Application No.: US12848237Application Date: 2010-08-02
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Publication No.: US08437077B2Publication Date: 2013-05-07
- Inventor: Chih-Kuang Chang , Dong-Hai Li , Li Jiang , Yong-Hong Ding , Xiao-Guang Xue
- Applicant: Chih-Kuang Chang , Dong-Hai Li , Li Jiang , Yong-Hong Ding , Xiao-Guang Xue
- Applicant Address: CN Shenzhen TW New Taipei
- Assignee: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: CN Shenzhen TW New Taipei
- Agency: Altis Law Group, Inc.
- Priority: CN200910307670 20090924
- Main IPC: G02B21/06
- IPC: G02B21/06 ; F21V33/00

Abstract:
A measurement apparatus includes a lamp mount including a first mount and a second mount. The first mount has a first cavity to mount an observation module. The second mount has a second cavity to mount an image capture module. The measurement apparatus further includes a plurality of light modules mounted on an undersurface of the lamp mount. The second mount is disposed with an included angle relative to a first axis of the first cavity so that a second axis of the second cavity and the first axis converge on a point. The undersurface of the lamp mount is concave so that light from the light modules tilts toward the first axis, and the light and the first axis also converge on the point.
Public/Granted literature
- US20110069383A1 MEASUREMENT APPARATUS Public/Granted day:2011-03-24
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