What is disclosed is a system and method for generating a destination profile LUT. In a manner more fully described herein, a high resolution LUT (e.g., 100-cube LUT) is received. Regions of high curvature of the gamut of an image output device are identified. A non-parametric dynamic optimization node selection method is utilized to select a subset of nodes from the high resolution profile LUT which captures these nonlinearities. Down-sampling the high resolution LUT produces a low resolution LUT. The low resolution LUT is up-sampled to a size of the high resolution LUT to obtain a reconstructed LUT. An error is then calculated between the reconstructed LUT and high resolution LUT. The process of node selection is iteratively repeated until all the subsets of nodes are considered. A destination profile LUT is then generated from the subset of nodes with the least error.