Invention Grant
- Patent Title: Drop test device for testing corner of case
- Patent Title (中): 跌落测试设备用于测试角落
-
Application No.: US12978130Application Date: 2010-12-23
-
Publication No.: US08443651B2Publication Date: 2013-05-21
- Inventor: Yin Le , Yu-Lin Liu , Qiang Zhang
- Applicant: Yin Le , Yu-Lin Liu , Qiang Zhang
- Applicant Address: CN Shenzhen TW New Taipei
- Assignee: Hong Fu Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Hong Fu Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: CN Shenzhen TW New Taipei
- Agency: Altis Law Group, Inc.
- Priority: CN201010240072 20100729
- Main IPC: G01N3/30
- IPC: G01N3/30
Abstract:
A drop test device for testing a corner portion of a work piece, includes a bottom board, a support pillar, and a hanging mechanism. The support pillar is mounted on the bottom board. The hanging mechanism is mounted on the support pillar and is located above the bottom board. The hanging mechanism includes a support member. The support member includes a triangle base. Angles and sides of the triangle base hold the work piece thereon to have a corner of the work piece directed towards the bottom board.
Public/Granted literature
- US20120024039A1 DROP TEST DEVICE Public/Granted day:2012-02-02
Information query
