发明授权
- 专利标题: Semiconductor having a high aspect ratio via
- 专利标题(中): 具有高纵横比的半导体
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申请号: US13481550申请日: 2012-05-25
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公开(公告)号: US08445380B2公开(公告)日: 2013-05-21
- 发明人: Yuan-Chih Hsieh , Richard Chu , Ming-Tung Wu , Martin Liu , Lan-Lin Chao , Chia-Shiung Tsai
- 申请人: Yuan-Chih Hsieh , Richard Chu , Ming-Tung Wu , Martin Liu , Lan-Lin Chao , Chia-Shiung Tsai
- 申请人地址: TW Hsin-Chu
- 专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人地址: TW Hsin-Chu
- 代理机构: Haynes and Boone, LLP
- 主分类号: H01L21/44
- IPC分类号: H01L21/44
摘要:
The present disclosure provides various embodiments of a via structure and method of manufacturing same. In an example, a method for forming a via structure includes forming a via in a semiconductor substrate, wherein via sidewalls of the via are defined by the semiconductor substrate; forming a dielectric layer on the via sidewalls; removing the dielectric layer from a portion of the via sidewalls; and forming a conductive layer to fill the via, wherein the conductive layer is disposed over the dielectric layer and the portion of the via sidewalls. In an example, the dielectric layer is an oxide layer.
公开/授权文献
- US20120238091A1 SEMICONDUCTOR HAVING A HIGH ASPECT RATIO VIA 公开/授权日:2012-09-20
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