发明授权
US08450154B2 Oxide based memory with a controlled oxygen vacancy conduction path
有权
具有受控氧空位传导路径的基于氧化物的存储器
- 专利标题: Oxide based memory with a controlled oxygen vacancy conduction path
- 专利标题(中): 具有受控氧空位传导路径的基于氧化物的存储器
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申请号: US13087050申请日: 2011-04-14
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公开(公告)号: US08450154B2公开(公告)日: 2013-05-28
- 发明人: Jun Liu , Gurtej Sandhu
- 申请人: Jun Liu , Gurtej Sandhu
- 申请人地址: US ID Boise
- 专利权人: Micron Technology, Inc.
- 当前专利权人: Micron Technology, Inc.
- 当前专利权人地址: US ID Boise
- 代理机构: Brooks, Cameron & Huebsch, PLLC
- 主分类号: H01L21/82
- IPC分类号: H01L21/82
摘要:
Methods, devices, and systems associated with oxide based memory can include a method of forming an oxide based memory cell. Forming an oxide based memory cell can include forming a first conductive element, forming a substoichiometric oxide over the first conductive element, forming a second conductive element over the substoichiometric oxide, and oxidizing edges of the substoichiometric oxide by subjecting the substoichiometric oxide to an oxidizing environment to define a controlled oxygen vacancy conduction path near a center of the oxide.
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