发明授权
US08450154B2 Oxide based memory with a controlled oxygen vacancy conduction path 有权
具有受控氧空位传导路径的基于氧化物的存储器

Oxide based memory with a controlled oxygen vacancy conduction path
摘要:
Methods, devices, and systems associated with oxide based memory can include a method of forming an oxide based memory cell. Forming an oxide based memory cell can include forming a first conductive element, forming a substoichiometric oxide over the first conductive element, forming a second conductive element over the substoichiometric oxide, and oxidizing edges of the substoichiometric oxide by subjecting the substoichiometric oxide to an oxidizing environment to define a controlled oxygen vacancy conduction path near a center of the oxide.
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