发明授权
- 专利标题: Method for stacked contact with low aspect ratio
- 专利标题(中): 低纵横比堆叠接触的方法
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申请号: US12973707申请日: 2010-12-20
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公开(公告)号: US08450200B2公开(公告)日: 2013-05-28
- 发明人: Chen-Hua Yu , Chen-Nan Yeh , Chih-Hsiang Yao , Wen-Kai Wan , Jye-Yen Cheng
- 申请人: Chen-Hua Yu , Chen-Nan Yeh , Chih-Hsiang Yao , Wen-Kai Wan , Jye-Yen Cheng
- 申请人地址: TW Hsin-Chu
- 专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人地址: TW Hsin-Chu
- 代理机构: Slater & Matsil, L.L.P.
- 主分类号: H01L21/44
- IPC分类号: H01L21/44
摘要:
A method for an integrated circuit structure includes providing a semiconductor substrate; forming a metallization layer over the semiconductor substrate; forming a first dielectric layer between the semiconductor substrate and the metallization layer; forming a second dielectric layer between the semiconductor substrate and the metallization layer, wherein the second dielectric layer is over the first dielectric layer; and forming a contact plug with an upper portion substantially in the second dielectric layer and a lower portion substantially in the first dielectric layer. The contact plug is electrically connected to a metal line in the metallization layer. The contact plug is discontinuous at an interface between the upper portion and the lower portion.
公开/授权文献
- US20110092019A1 Method for Stacked Contact with Low Aspect Ratio 公开/授权日:2011-04-21
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