发明授权
US08450682B2 Ionization method and apparatus using a probe, and analytical method and apparatus 有权
使用探针的电离方法和装置,以及分析方法和装置

  • 专利标题: Ionization method and apparatus using a probe, and analytical method and apparatus
  • 专利标题(中): 使用探针的电离方法和装置,以及分析方法和装置
  • 申请号: US13125437
    申请日: 2009-10-19
  • 公开(公告)号: US08450682B2
    公开(公告)日: 2013-05-28
  • 发明人: Kenzo Hiraoka
  • 申请人: Kenzo Hiraoka
  • 申请人地址: JP Kofu-Shi
  • 专利权人: University of Yamanashi
  • 当前专利权人: University of Yamanashi
  • 当前专利权人地址: JP Kofu-Shi
  • 代理机构: Birch, Stewart, Kolasch & Birch, LLP
  • 优先权: JP2008-271954 20081022
  • 国际申请: PCT/JP2009/068294 WO 20091019
  • 国际公布: WO2010/047399 WO 20100429
  • 主分类号: H01J49/10
  • IPC分类号: H01J49/10
Ionization method and apparatus using a probe, and analytical method and apparatus
摘要:
The tip of an electrically conductive probe 11 is brought into contact with a sample and captures the sample S under atmospheric pressure, a high voltage for electrospray is applied to the probe 11 while a solvent is supplied to the tip of the probe 11 that has captured the sample, and molecules of the sample S at the probe tip are ionized. A miniscule amount of a fine solvent droplet is supplied to the probe tip and slow electrospray is implemented. As a result, the size of the electrically charged droplet can be made extremely small and components within the sample can be analyzed extensively without selectivity. Further, in imaging over an extended period of time, electrospray is possible even in the event that the sample dries.
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