Invention Grant
- Patent Title: Quantification method of functional groups of organic layer
- Patent Title (中): 有机层官能团的定量方法
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Application No.: US13063616Application Date: 2009-09-24
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Publication No.: US08450684B2Publication Date: 2013-05-28
- Inventor: Tae Geol Lee , Dae Won Moon , Hyegeun Min
- Applicant: Tae Geol Lee , Dae Won Moon , Hyegeun Min
- Applicant Address: KR
- Assignee: Korea Research Institute of Standards and Science
- Current Assignee: Korea Research Institute of Standards and Science
- Current Assignee Address: KR
- Agency: Cantor Colburn LLP
- Priority: KR10-2008-0094625 20080926; KR10-2009-0090385 20090924
- International Application: PCT/KR2009/005454 WO 20090924
- International Announcement: WO2010/036038 WO 20100401
- Main IPC: G01N23/203
- IPC: G01N23/203

Abstract:
A quantification method of functional groups in an organic thin layer includes: a) measuring an absolute quantity per unit area of an analysis reference material having functional groups included in a reference organic thin layer by means of MEIS spectroscopy; b) carrying out spectrometry for the same reference organic thin layer as in a) and thereby obtaining peak intensities of the functional groups in the reference organic thin layer; c) carrying out the same spectrometry as in b) for an organic thin layer to be analyzed having the same functional groups and thereby measuring peak intensities of the functional groups with unknown quantity; and d) comparing the peak intensities of the functional groups measured in b) with respect to the absolute quantity of the analysis reference material in a) and thereby determining the absolute quantity per unit area of the functional groups with unknown quantity measured in c).
Public/Granted literature
- US20110163228A1 QUANTIFICATION METHOD OF FUNCTIONAL GROUPS OF ORGANIC LAYER Public/Granted day:2011-07-07
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