Invention Grant
- Patent Title: On-chip self calibrating delay monitoring circuitry
- Patent Title (中): 片内自校准延迟监控电路
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Application No.: US13535440Application Date: 2012-06-28
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Publication No.: US08451043B2Publication Date: 2013-05-28
- Inventor: Thomas Baumann , Christian Pacha , Stephan Henzler , Peter Huber
- Applicant: Thomas Baumann , Christian Pacha , Stephan Henzler , Peter Huber
- Applicant Address: DE Neubiberg
- Assignee: Intel Mobile Communications GmbH
- Current Assignee: Intel Mobile Communications GmbH
- Current Assignee Address: DE Neubiberg
- Agency: Eschweiler & Associates LLC
- Main IPC: H03H11/26
- IPC: H03H11/26
Abstract:
The present disclosure relates to on-chip self calibrating delay monitoring circuitry.
Public/Granted literature
- US20120262213A1 On-Chip Self Calibrating Delay Monitoring Circuitry Public/Granted day:2012-10-18
Information query
