Invention Grant
- Patent Title: Apparatus and method for detecting array substrate
- Patent Title (中): 阵列基板检测装置及方法
-
Application No.: US12907416Application Date: 2010-10-19
-
Publication No.: US08451445B2Publication Date: 2013-05-28
- Inventor: Guoxiao Bai , Chao Tian
- Applicant: Guoxiao Bai , Chao Tian
- Applicant Address: CN Beijing
- Assignee: Beijing BOE Optoelectronics Technology Co., Ltd.
- Current Assignee: Beijing BOE Optoelectronics Technology Co., Ltd.
- Current Assignee Address: CN Beijing
- Agency: Ladas & Parry LLP
- Priority: CN200910236438 20091021
- Main IPC: G01J4/00
- IPC: G01J4/00

Abstract:
An apparatus for detecting an array substrate comprises: a transparent carrier for supporting an array substrate to be detected thereon; a light source disposed on one side of the transparent carrier; and a modulator disposed on the other side in parallel with the transparent carrier. The modulator comprises a liquid crystal layer and two transparent substrate layers disposed on both sides of the liquid crystal layer, and one transparent substrate layer away from the transparent carrier is a first transparent conductive substrate layer, and a second polarizer is disposed thereon. A first polarizer is disposed between the light source and the transparent carrier, so that the light emitted from the light source is transmitted through the first polarizer to the transparent carrier. A light receiver receives the light emitted from the light source and then transmitted through the transparent carrier, the array substrate and the modulator.
Public/Granted literature
- US20110090502A1 APPARATUS AND METHOD FOR DETECTING ARRAY SUBSTRATE Public/Granted day:2011-04-21
Information query