Laser repairing apparatus and laser repairing method for substrate
    1.
    发明授权
    Laser repairing apparatus and laser repairing method for substrate 有权
    激光修复装置及激光修复方法

    公开(公告)号:US09291839B2

    公开(公告)日:2016-03-22

    申请号:US13699567

    申请日:2012-08-15

    CPC classification number: G02F1/1303 B23K26/38

    Abstract: According to embodiments of the present invention, there are disclosed a laser repairing apparatus and a laser repairing method for a substrate. The laser repairing apparatus comprises: a laser emitter; and a light transmission sheet with a light-shielding pattern, wherein a laser emitted by the laser emitter is used to cut a superfluous remainder of an electrode on the substrate, the light transmission sheet is located between the laser emitter and the substrate, and as compared with a pattern of the electrode on the substrate, the light-shielding pattern on the light transmission sheet has the same shape and a size at a predetermined ratio.

    Abstract translation: 根据本发明的实施例,公开了一种用于基板的激光修复装置和激光修复方法。 激光修复装置包括:激光发射器; 以及具有遮光图案的透光片,其中使用由激光发射器发射的激光来切割基板上的多余的电极余量,光透射片位于激光发射器和基板之间,并且如 与基板上的电极的图案相比,透光片上的遮光图案具有相同的形状和尺寸,以预定的比例。

    APPARATUS AND METHOD FOR DETECTING ARRAY SUBSTRATE
    2.
    发明申请
    APPARATUS AND METHOD FOR DETECTING ARRAY SUBSTRATE 有权
    用于检测阵列基板的装置和方法

    公开(公告)号:US20110090502A1

    公开(公告)日:2011-04-21

    申请号:US12907416

    申请日:2010-10-19

    CPC classification number: G09G3/006 G02F2001/136254 G09G3/3611

    Abstract: An apparatus for detecting an array substrate, comprising: a transparent carrier for supporting an array substrate to be detected thereon; a light source disposed on one side of the transparent carrier; a modulator disposed on the other side of the transparent carrier in parallel with the transparent carrier, and comprising a liquid crystal layer and two transparent substrate layers disposed on both sides of the liquid crystal layers, wherein one transparent substrate layer away from the transparent carrier is a first transparent conductive substrate layer, and a second polarizer is disposed on the first transparent conductive substrate layer; a first polarizer, disposed between the light source and the transparent carrier, so that the light emitted from the light source is transmitted through the first polarizer to radiate on the transparent carrier; and a light receiver receiving the light emitted from the light source and then transmitted through the transparent carrier, the array substrate to be detected and the modulator.

    Abstract translation: 一种用于检测阵列基板的装置,包括:用于支撑待检测阵列基板的透明载体; 设置在透明载体的一侧的光源; 与透明载体平行设置在透明载体的另一侧的调制器,包括液晶层和设置在液晶层两侧的两个透明基板层,其中离开透明载体的一个透明基板层是 第一透明导电基板层和第二偏光片设置在第一透明导电基板层上; 第一偏振器,设置在光源和透明载体之间,使得从光源发射的光透射穿过第一偏振器以辐射在透明载体上; 以及光接收器,接收从光源发射的光,然后透过透明载体,要检测的阵列基板和调制器。

    Apparatus and method for detecting array substrate
    3.
    发明授权
    Apparatus and method for detecting array substrate 有权
    阵列基板检测装置及方法

    公开(公告)号:US08451445B2

    公开(公告)日:2013-05-28

    申请号:US12907416

    申请日:2010-10-19

    CPC classification number: G09G3/006 G02F2001/136254 G09G3/3611

    Abstract: An apparatus for detecting an array substrate comprises: a transparent carrier for supporting an array substrate to be detected thereon; a light source disposed on one side of the transparent carrier; and a modulator disposed on the other side in parallel with the transparent carrier. The modulator comprises a liquid crystal layer and two transparent substrate layers disposed on both sides of the liquid crystal layer, and one transparent substrate layer away from the transparent carrier is a first transparent conductive substrate layer, and a second polarizer is disposed thereon. A first polarizer is disposed between the light source and the transparent carrier, so that the light emitted from the light source is transmitted through the first polarizer to the transparent carrier. A light receiver receives the light emitted from the light source and then transmitted through the transparent carrier, the array substrate and the modulator.

    Abstract translation: 一种用于检测阵列基板的装置,包括:用于支撑待检测阵列基板的透明载体; 设置在透明载体的一侧的光源; 以及与透明载体平行设置在另一侧的调制器。 调制器包括液晶层和设置在液晶层两侧的两个透明基板层,离开透明载体的一个透明基板层是第一透明导电基板层,并且第二偏光片设置在其上。 第一偏振器设置在光源和透明载体之间,使得从光源发射的光通过第一偏振器透射到透明载体。 光接收器接收从光源发射的光,然后透过透明载体,阵列基片和调制器。

    LASER REPAIRING APPARATUS AND LASER REPAIRING METHOD FOR SUBSTRATE
    4.
    发明申请
    LASER REPAIRING APPARATUS AND LASER REPAIRING METHOD FOR SUBSTRATE 有权
    激光修复装置和激光修复方法

    公开(公告)号:US20130105451A1

    公开(公告)日:2013-05-02

    申请号:US13699567

    申请日:2012-08-15

    CPC classification number: G02F1/1303 B23K26/38

    Abstract: According to embodiments of the present invention, there are disclosed a laser repairing apparatus and a laser repairing method for a substrate. The laser repairing apparatus comprises: a laser emitter; and a light transmission sheet with a light-shielding pattern, wherein a laser emitted by the laser emitter is used to cut a superfluous remainder of an electrode on the substrate, the light transmission sheet is located between the laser emitter and the substrate, and as compared with a pattern of the electrode on the substrate, the light-shielding pattern on the light transmission sheet has the same shape and a size at a predetermined ratio.

    Abstract translation: 根据本发明的实施例,公开了一种用于基板的激光修复装置和激光修复方法。 激光修复装置包括:激光发射器; 以及具有遮光图案的透光片,其中使用由激光发射器发射的激光来切割基板上的多余的电极余量,光透射片位于激光发射器和基板之间,并且如 与基板上的电极的图案相比,透光片上的遮光图案具有相同的形状和尺寸,以预定的比例。

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