Invention Grant
- Patent Title: Drop test device
- Patent Title (中): 跌落测试设备
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Application No.: US12981215Application Date: 2010-12-29
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Publication No.: US08453490B2Publication Date: 2013-06-04
- Inventor: Yin Le , Yu-Lin Liu , Qiang Zhang
- Applicant: Yin Le , Yu-Lin Liu , Qiang Zhang
- Applicant Address: CN Shenzhen TW New Taipei
- Assignee: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: CN Shenzhen TW New Taipei
- Agency: Altis Law Group, Inc.
- Priority: CN201010240071 20100729
- Main IPC: G01N3/30
- IPC: G01N3/30

Abstract:
A drop test device for testing the strength of a product includes an operating platform and a hanging mechanism. The operating platform includes a bottom board, a pillar substantially perpendicularly connected to the bottom board and a support member rotatably secured on the pillar. The hanging mechanism is mounted to the pillar, and includes a clamp member for positioning the product. The product is sandwiched by the clamp member so an arris of the product abuts the support member. The support plate is rotated away from the product, so the product can be disengaged from the clamp member and dropped towards the bottom board.
Public/Granted literature
- US20120024040A1 DROP TEST DEVICE Public/Granted day:2012-02-02
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