发明授权
- 专利标题： Probe
- 专利标题（中）： 探测
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申请号： US12770990申请日： 2010-04-30
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公开(公告)号： US08456156B2公开(公告)日： 2013-06-04
- 发明人: Xu Gao , Zhi-Jun Zhang , Zheng-He Feng , Steven-Philip Marcher , Zhan Li , Yong Yan
- 申请人： Xu Gao , Zhi-Jun Zhang , Zheng-He Feng , Steven-Philip Marcher , Zhan Li , Yong Yan
- 申请人地址： CN Beijing TW New Taipei
- 专利权人： Tsinghua University,Hon Hai Precision Industry Co., Ltd.
- 当前专利权人： Tsinghua University,Hon Hai Precision Industry Co., Ltd.
- 当前专利权人地址： CN Beijing TW New Taipei
- 代理机构： Altis Law Group, Inc.
- 优先权： CN200910110163 20091030
- 主分类号： G01R1/06
- IPC分类号： G01R1/06
摘要：
A probe includes a circuit board, an electric field detecting probe, and a magnetic field detecting probe. The electric field detecting probe and the magnetic field detecting probe are located on the circuit board. An anti-jamming distance between the two detecting probes is a multiple of 5 millimeters and is greater than or equal to 10 millimeters.
公开/授权文献
- US20110101962A1 PROBE 公开/授权日：2011-05-05
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