Invention Grant
- Patent Title: Optical component focus testing apparatus and method
- Patent Title (中): 光学元件聚焦测试仪和方法
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Application No.: US12604253Application Date: 2009-10-22
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Publication No.: US08456623B2Publication Date: 2013-06-04
- Inventor: Colin McGarry , Gilles Dufaure De Lajarte
- Applicant: Colin McGarry , Gilles Dufaure De Lajarte
- Applicant Address: GB Marlow, Buckinghamshire
- Assignee: STMicroelectronics (Research & Development) Ltd.
- Current Assignee: STMicroelectronics (Research & Development) Ltd.
- Current Assignee Address: GB Marlow, Buckinghamshire
- Agency: Gardere Wynne Sewell LLP
- Priority: GB0821503.0 20081125
- Main IPC: G01B9/00
- IPC: G01B9/00

Abstract:
An optical component focus testing apparatus includes a plurality of test pattern displays. One or more illuminators are configured to selectively illuminate different test pattern displays at different times. Light directors are provided to direct light from at least one of the illuminated test pattern displays towards an optical component under test. The light directors and test pattern displays are arranged such that, in use, light directed from different illuminated test pattern displays travel different distances to reach the optical component under test.
Public/Granted literature
- US20100188653A1 OPTICAL COMPONENT FOCUS TESTING APPARATUS AND METHOD Public/Granted day:2010-07-29
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