发明授权
- 专利标题: Memory with self-test function and method for testing the same
- 专利标题(中): 内存具有自检功能和测试方法
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申请号: US13007691申请日: 2011-01-17
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公开(公告)号: US08479060B2公开(公告)日: 2013-07-02
- 发明人: Shuo-Fen Kuo , Jih-Nung Lee , Sung-Kuang Wu
- 申请人: Shuo-Fen Kuo , Jih-Nung Lee , Sung-Kuang Wu
- 申请人地址: TW Hsinchu
- 专利权人: Realtek Semiconductor Corp.
- 当前专利权人: Realtek Semiconductor Corp.
- 当前专利权人地址: TW Hsinchu
- 代理机构: McClure, Qualey & Rodack, LLP
- 优先权: TW99101195A 20100118
- 主分类号: G11C29/00
- IPC分类号: G11C29/00
摘要:
The present invention relates to a memory with a self-test function and a method for testing the same. The memory comprises a testing unit, a memory unit, and a comparison module. The method for testing the memory comprises steps of the testing unit producing a pattern signal; a first storage block of the memory unit storing storage data, and outputting the storage data according to the pattern signal; a second storage block of the memory storing a compare signature corresponding to the storage data; and the compare module producing a test signature according to the storage data output by the memory unit, and comparing the test signature to the compare signature and outputting a testing result for judging validity of the memory unit. Thereby, the memory unit according to the present invention is partitioned into two storage blocks for storing the storage data and the compare signature, respectively, and thus achieving the purposes of saving the testing time, costs, and hardware resources.
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