Invention Grant
- Patent Title: Open loop type delay locked loop and method for operating the same
- Patent Title (中): 开环型延时锁定环及其操作方法
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Application No.: US12832549Application Date: 2010-07-08
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Publication No.: US08482331B2Publication Date: 2013-07-09
- Inventor: Seung-Joon Ahn , Jong-Chern Lee
- Applicant: Seung-Joon Ahn , Jong-Chern Lee
- Applicant Address: KR Gyeonggi-do
- Assignee: Hynix Semiconductor Inc.
- Current Assignee: Hynix Semiconductor Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: IP & T Group LLP
- Priority: KR10-2010-0049618 20100527
- Main IPC: H03H11/26
- IPC: H03H11/26

Abstract:
An open loop type delay locked loop includes a delay amount pulse generation unit configured to generate a delay amount pulse having a pulse width corresponding to a delay amount for delay locking a clock signal, a delay amount coding unit configured to output a code value by coding the delay amount in response to the delay amount pulse, a clock control unit configured to adjust a toggling period of the clock signal in response to a control signal, and a delay line configured to delay an adjusted clock signal outputted from the clock control unit in response to the code value.
Public/Granted literature
- US20110291730A1 OPEN LOOP TYPE DELAY LOCKED LOOP AND METHOD FOR OPERATING THE SAME Public/Granted day:2011-12-01
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