Invention Grant
US08483991B2 Method and system for measuring thermal radiation to determine temperature and emissivity of an object
有权
用于测量热辐射以确定物体的温度和发射率的方法和系统
- Patent Title: Method and system for measuring thermal radiation to determine temperature and emissivity of an object
- Patent Title (中): 用于测量热辐射以确定物体的温度和发射率的方法和系统
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Application No.: US12466683Application Date: 2009-05-15
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Publication No.: US08483991B2Publication Date: 2013-07-09
- Inventor: Reno Gaertner , Steffen Ludwig , Rainer Kuepper , Klaus-Peter Moellmann
- Applicant: Reno Gaertner , Steffen Ludwig , Rainer Kuepper , Klaus-Peter Moellmann
- Applicant Address: US WA Everett
- Assignee: Fluke Corporation
- Current Assignee: Fluke Corporation
- Current Assignee Address: US WA Everett
- Agency: Perkins Coie LLP
- Main IPC: G01K11/30
- IPC: G01K11/30
Abstract:
A system and method are disclosed that determines the emissivity and temperature of a target object. A compact emitter capable of sequentially emitting blackbody-like radiation at two different temperatures is used to determine the target object's emissivity and temperature.
Public/Granted literature
- US20100292951A1 METHOD AND SYSTEM FOR MEASURING THERMAL RADIATION TO DETERMINE TEMPERATURE AND EMISSIVITY OF AN OBJECT Public/Granted day:2010-11-18
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