Abstract:
A temperature measurement sensor for use in a nuclear reactor is described. The sensor includes a first neutron detector member and a second neutron detector member. The first neutron detector includes an outer shield material with an effective neutron capture cross section that is temperature dependent. The first neutron detector member outputs a first current signal and the second neutron detector member outputs a second current signal. An electrical connection between the first and second neutron detector members produces a net current that is the difference in current between the first and second signals. The difference is proportional to changes in temperature.
Abstract:
An acoustic lens suitable for a CMUT array (74) is provided. The acoustic lens comprising: a first layer (47) comprising a thermoset elastomer having a polymeric material selected from hydrocarbons, wherein the first layer has an inner surface (72) arranged to face the array and an outer convex shaped surface (40) arranged to oppose the inner surface; and a second layer (42) coupled to the outer surface of the first layer and comprising thermoplastic polymer polymethylpentene and an elastomer selected from the polyolefin family (POE) blended therein, wherein the outer layer located at the outer surface of the acoustic window layer, wherein the first layer has a first acoustic wave velocity (v1) and the second layer has a second acoustic wave velocity (v2), said second velocity is larger than the first acoustic wave velocity.
Abstract:
Disclosed is a method of using a charged particle microscope for inspecting a sample mounted on a sample holder. The microscope is equipped with a solid state detector for detecting secondary particles emanating from the sample in response to irradiation of the sample with the primary beam, with the solid state detector in direct optical view of the sample. In some embodiments, the sample is mounted on a heater with a fast thermal response time. The method comprises contactless measurement of the temperature of the sample and/or sample holder using the solid state detector.
Abstract:
An electronic thermometer includes a probe adapted to be heated by a subject for use in measuring a temperature of the subject. At least one temperature sensor detects a temperature of the probe. A probe sensor detects a condition at the probe. The probe sensor has an idle condition when the probe is not inserted into the subject. A processor is operatively connected to the probe sensor and programmed to monitor a change in the condition of the probe sensor from the idle condition to determine whether the probe has been received in a probe cover and inserted into the subject.
Abstract:
High resolution distributed temperature sensors using fiber optic distributed temperature sensing systems deployed on various carriers to significantly improve spatial resolution and provide high resolution temperature profile and detection of fluid or fluid interface levels.
Abstract:
A method for estimating an operating temperature of component in turbo machinery includes providing body detachably affixed to component, operating machinery, stopping operation of machinery, and removing body. The method includes obtaining concentration profile by determining final concentration of at least one species in first material and in second material, and determining a transient concentration of at least one species between first material and second material. The method includes determining an operating temperature by correlating concentration profile to corresponding operating temperature for system. A system including body is also provided. Body includes at least one species, a first material having a starting first concentration of the species, a second material arranged to permit migration of the species from first material to second material. Species migrates from first material to second material during operation of turbo machinery allowing body to estimate temperature during operation.
Abstract:
The invention is an apparatus and method including hardware and software, which allows collecting and analyzing data to obtain information about mechanical properties of soft materials in a much faster way. The apparatus can be used as a stand-alone deice or an add-on to the existing AFM device. The apparatus allows collecting dynamical measurements using a set of multiple frequencies of interest at once, in one measurement instead of sequential, one frequency in a time; measurements.
Abstract:
A method of classifying an electromagnetic-energy emitting source event as one of a first, second, and third class event includes registering an irradiance spectrum from the source event. The intensity of the energy emitted from the source event is measured within each of first, second and third energy sub-ranges and first, second and third relative-energy values are associated with, respectively, the first, second and third energy sub-ranges. A first class-eliminating determination is rendered by comparing to one another a first selected set of two of the relative-energy values, thereby yielding two remaining-candidate event classes. When necessary, a second class-eliminating determination renders the proper classification for the source event by comparing to one another a second selected set of relative-energy values including the relative-energy value not selected for inclusion in the first selected set of two relative-energy values and one of the previously selected relative-energy values. The energy-value comparisons are carried out with reference to modeled source-event irradiance data from which expected ratio behaviors among the selected energy sub-ranges are ascertainable relative particular event types at various ranges and under disparate atmospheric conditions.
Abstract:
Techniques for determining certain parameters of semiconductor specimens using X-ray spectroscopy are described. The invention can be used to determine parameters such as composition, dimensions, and density of semiconductor specimens. Specifically, an X-ray spectrum simulation algorithm is used to iteratively generate a theoretical X-ray spectrum for a semiconductor specimen having certain parameters. The iterative generation of theoretical X-ray spectrums continues until one of the theoretical X-ray spectrum closely matches the actual X-ray spectrum measured off of the specimen. In an alternative embodiment, this technique of generating theoretical X-ray spectrums can be used in combination with a pre-existing library of X-ray spectral signatures for semiconductor specimens having various parameters.
Abstract:
A method of stabilizing temperature sensing in presence of temperature-sensing component temperature variation includes steps of: obtaining response value caused by black body at first temperature of a thermal imager core chip; obtaining high-temperature first-order linear function of high-temperature black body response value versus thermal imager core chip temperature; obtaining low-temperature first-order linear function of low-temperature black body response value versus thermal imager core chip temperature; obtaining response value of high-temperature first-order linear function at first temperature, response value of high-temperature first-order linear function at second temperature of the thermal imager core chip, response value of low-temperature first-order linear function at first temperature, response value of low-temperature first-order linear function at second temperature, and response value of black body and substituting the five values into an equation for correcting the response values; and obtaining instant corrected value of the response value of the black body.