Capacitive sensor for thermometer probe
    4.
    发明授权
    Capacitive sensor for thermometer probe 有权
    用于温度计探头的电容传感器

    公开(公告)号:US08949065B2

    公开(公告)日:2015-02-03

    申请号:US13249661

    申请日:2011-09-30

    CPC classification number: G01J5/049 G01J5/021 G01J5/026 G01J5/0893

    Abstract: An electronic thermometer includes a probe adapted to be heated by a subject for use in measuring a temperature of the subject. At least one temperature sensor detects a temperature of the probe. A probe sensor detects a condition at the probe. The probe sensor has an idle condition when the probe is not inserted into the subject. A processor is operatively connected to the probe sensor and programmed to monitor a change in the condition of the probe sensor from the idle condition to determine whether the probe has been received in a probe cover and inserted into the subject.

    Abstract translation: 电子体温计包括适于由受试者加热以用于测量受试者的温度的探针。 至少有一个温度传感器检测探头的温度。 探头传感器检测探头处的状况。 当探针未插入被摄体时,探头传感器有空闲状态。 处理器可操作地连接到探针传感器并被编程为监测探针传感器从空转状态的变化,以确定探针是否已被接收在探针盖中并插入到受试者中。

    SYSTEM AND METHOD FOR ESTIMATING OPERATING TEMPERATURE OF TURBO MACHINERY
    6.
    发明申请
    SYSTEM AND METHOD FOR ESTIMATING OPERATING TEMPERATURE OF TURBO MACHINERY 有权
    涡轮机械运行温度估算系统及方法

    公开(公告)号:US20130129510A1

    公开(公告)日:2013-05-23

    申请号:US13299114

    申请日:2011-11-17

    CPC classification number: G01K3/04 G01K11/06 G01K13/02 G01K2013/024

    Abstract: A method for estimating an operating temperature of component in turbo machinery includes providing body detachably affixed to component, operating machinery, stopping operation of machinery, and removing body. The method includes obtaining concentration profile by determining final concentration of at least one species in first material and in second material, and determining a transient concentration of at least one species between first material and second material. The method includes determining an operating temperature by correlating concentration profile to corresponding operating temperature for system. A system including body is also provided. Body includes at least one species, a first material having a starting first concentration of the species, a second material arranged to permit migration of the species from first material to second material. Species migrates from first material to second material during operation of turbo machinery allowing body to estimate temperature during operation.

    Abstract translation: 用于估计涡轮机械中的部件的工作温度的方法包括提供可拆卸地固定到部件,操作机械,停止机械操作和移除主体的主体。 该方法包括通过确定第一材料和第二材料中的至少一种物质的最终浓度并确定第一材料和第二材料之间的至少一种物质的瞬时浓度来获得浓度分布。 该方法包括通过将浓度分布与系统的相应操作温度相关联来确定操作温度。 还提供了包括身体的系统。 身体包括至少一种物质,具有物种起始第一浓度的第一种物质,被布置成允许物质从第一物质迁移到第二物质的第二物质。 在涡轮机械运行期间,物种从第一种材料迁移到第二种材料,允许物体在运行过程中估计温度。

    Method of and apparatus for studying fast dynamical mechanical response of soft materials
    7.
    再颁专利
    Method of and apparatus for studying fast dynamical mechanical response of soft materials 有权
    研究软材料快速动力学机械响应的方法和装置

    公开(公告)号:USRE43117E1

    公开(公告)日:2012-01-17

    申请号:US13103566

    申请日:2011-05-09

    Applicant: Igor Sokolov

    Inventor: Igor Sokolov

    CPC classification number: G01Q60/32 G01Q30/04

    Abstract: The invention is an apparatus and method including hardware and software, which allows collecting and analyzing data to obtain information about mechanical properties of soft materials in a much faster way. The apparatus can be used as a stand-alone deice or an add-on to the existing AFM device. The apparatus allows collecting dynamical measurements using a set of multiple frequencies of interest at once, in one measurement instead of sequential, one frequency in a time; measurements.

    Abstract translation: 本发明是一种包括硬件和软件的装置和方法,其允许以更快的方式收集和分析数据以获得关于软材料的机械性质的信息。 该设备可以用作独立的设备或现有AFM设备的附件。 该装置允许一次使用一组感兴趣的频率进行动态测量,在一次测量中,而不是一次的顺序的一个频率; 测量。

    System and method for spectral-based passive threat warning
    8.
    发明授权
    System and method for spectral-based passive threat warning 失效
    基于频谱的被动威胁警告的系统和方法

    公开(公告)号:US08017912B1

    公开(公告)日:2011-09-13

    申请号:US11796928

    申请日:2007-04-30

    Abstract: A method of classifying an electromagnetic-energy emitting source event as one of a first, second, and third class event includes registering an irradiance spectrum from the source event. The intensity of the energy emitted from the source event is measured within each of first, second and third energy sub-ranges and first, second and third relative-energy values are associated with, respectively, the first, second and third energy sub-ranges. A first class-eliminating determination is rendered by comparing to one another a first selected set of two of the relative-energy values, thereby yielding two remaining-candidate event classes. When necessary, a second class-eliminating determination renders the proper classification for the source event by comparing to one another a second selected set of relative-energy values including the relative-energy value not selected for inclusion in the first selected set of two relative-energy values and one of the previously selected relative-energy values. The energy-value comparisons are carried out with reference to modeled source-event irradiance data from which expected ratio behaviors among the selected energy sub-ranges are ascertainable relative particular event types at various ranges and under disparate atmospheric conditions.

    Abstract translation: 将电磁能发射源事件分类为第一,第二和第三类事件之一的方法包括从源事件登记辐照度谱。 在源事件中发射的能量的强度在第一,第二和第三能量子范围内的每一个中被测量,并且第一,第二和第三相对能量值分别与第一,第二和第三能量子范围相关联 。 通过彼此比较相对能量值中的两个相对能量值的第一选择集合来呈现第一类别消除确定,从而产生两个剩余候选事件类别。 必要时,第二类别消除确定通过彼此比较第二选择的相对能量集合来呈现源事件的适当分类,所述第二选择的一组相对能量值包括未被选择以包括在第二选定组的两个相对能量值中的相对能量值, 能量值和先前选择的相对能量值之一。 能量值比较是参考建模的源事件辐照度数据进行的,从而可以在各种范围和不同的大气条件下确定所选能量子范围内的预期比例行为相对特定事件类型。

    Spectrum simulation for semiconductor feature inspection
    9.
    发明授权
    Spectrum simulation for semiconductor feature inspection 有权
    半导体特征检测的频谱模拟

    公开(公告)号:US06996492B1

    公开(公告)日:2006-02-07

    申请号:US10804826

    申请日:2004-03-18

    Inventor: Anne L. Testoni

    CPC classification number: G01N23/2252

    Abstract: Techniques for determining certain parameters of semiconductor specimens using X-ray spectroscopy are described. The invention can be used to determine parameters such as composition, dimensions, and density of semiconductor specimens. Specifically, an X-ray spectrum simulation algorithm is used to iteratively generate a theoretical X-ray spectrum for a semiconductor specimen having certain parameters. The iterative generation of theoretical X-ray spectrums continues until one of the theoretical X-ray spectrum closely matches the actual X-ray spectrum measured off of the specimen. In an alternative embodiment, this technique of generating theoretical X-ray spectrums can be used in combination with a pre-existing library of X-ray spectral signatures for semiconductor specimens having various parameters.

    Abstract translation: 描述了使用X射线光谱确定半导体样品的某些参数的技术。 本发明可用于确定半导体样品的组成,尺寸和密度等参数。 具体地,使用X射线光谱模拟算法迭代地生成具有某些参数的半导体样本的理论X射线光谱。 理论X射线谱的迭代生成继续进行,直到理论X射线谱之一与测得的实际X射线光谱密切相关。 在替代实施例中,产生理论X射线光谱的技术可以与用于具有各种参数的半导体样本的X射线光谱特征的预先存在的文库结合使用。

    METHOD OF STABILIZING TEMPERATURE SENSING IN THE PRESENCE OF TEMPERATURE-SENSING COMPONENT TEMPERATURE VARIATION

    公开(公告)号:US20230314238A1

    公开(公告)日:2023-10-05

    申请号:US17707997

    申请日:2022-03-30

    CPC classification number: G01K1/20 G01J5/53 G01K11/30

    Abstract: A method of stabilizing temperature sensing in presence of temperature-sensing component temperature variation includes steps of: obtaining response value caused by black body at first temperature of a thermal imager core chip; obtaining high-temperature first-order linear function of high-temperature black body response value versus thermal imager core chip temperature; obtaining low-temperature first-order linear function of low-temperature black body response value versus thermal imager core chip temperature; obtaining response value of high-temperature first-order linear function at first temperature, response value of high-temperature first-order linear function at second temperature of the thermal imager core chip, response value of low-temperature first-order linear function at first temperature, response value of low-temperature first-order linear function at second temperature, and response value of black body and substituting the five values into an equation for correcting the response values; and obtaining instant corrected value of the response value of the black body.

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