发明授权
- 专利标题: Trench semiconductor device and method of manufacturing
- 专利标题(中): 沟槽半导体器件及其制造方法
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申请号: US12847537申请日: 2010-07-30
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公开(公告)号: US08487370B2公开(公告)日: 2013-07-16
- 发明人: Oliver Blank , Ralf Siemieniec , Martin Poelzl , Maximilian Roesch
- 申请人: Oliver Blank , Ralf Siemieniec , Martin Poelzl , Maximilian Roesch
- 申请人地址: AT Villach
- 专利权人: Infineon Technologies Austria AG
- 当前专利权人: Infineon Technologies Austria AG
- 当前专利权人地址: AT Villach
- 代理机构: Murphy, Bilak & Homiller, PLLC
- 主分类号: H01L21/336
- IPC分类号: H01L21/336 ; H01L29/78
摘要:
A semiconductor device includes a semiconductor body including a trench with first and second opposing sidewalls. A first electrode is arranged in a lower portion of the trench and a second electrode in an upper portion of the trench. A dielectric structure is arranged in the trench, including a first portion between the electrodes. The first portion includes, in sequence along a lateral direction from the first sidewall to the second sidewall, a first part including a first dielectric material, a second part including a second dielectric material selectively etchable to the first dielectric material, a third part including the first dielectric material, the first dielectric material of the third part being continuously arranged along a vertical direction from a top side of the first electrode to a bottom side of the second electrode, a fourth part including the second dielectric material and a fifth part including the first dielectric material.
公开/授权文献
- US20120025304A1 Trench Semiconductor Device and Method of Manufacturing 公开/授权日:2012-02-02
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