发明授权
- 专利标题: Inspection system and method for fast changes of focus
- 专利标题(中): 检测系统和方法快速改变焦点
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申请号: US13224096申请日: 2011-09-01
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公开(公告)号: US08488117B2公开(公告)日: 2013-07-16
- 发明人: Haim Feldman , Boris Morgenstein , Roman Naidis , Adam Baer
- 申请人: Haim Feldman , Boris Morgenstein , Roman Naidis , Adam Baer
- 申请人地址: IL Rehovot
- 专利权人: Applied Materials Israel, Ltd.
- 当前专利权人: Applied Materials Israel, Ltd.
- 当前专利权人地址: IL Rehovot
- 代理机构: Kilpatrick Townsend & Stockton LLP
- 主分类号: G01N21/00
- IPC分类号: G01N21/00
摘要:
An inspection system includes a first focusing unit configured to perform fast focus changes to a first focusing function applied to an incident light beam. A traveling lens acousto-optic device is arranged to receive the light beam focused by the first focusing function and produce focused spots using a plurality of traveling lenses generated in response to radio frequency signals. The traveling lenses apply a second focusing function and the traveling lens acousto-optic device is arranged to alter the second focusing function at a fast rate. The inspection system also includes optics arranged to direct the focused spots onto an inspected object and to direct radiation from the inspected object to a sensor.
公开/授权文献
- US20120086937A1 INSPECTION SYSTEM AND METHOD FOR FAST CHANGES OF FOCUS 公开/授权日:2012-04-12
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