发明授权
- 专利标题: Measuring method of a magnetic head and measuring apparatus thereof
- 专利标题(中): 磁头的测量方法及其测量装置
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申请号: US13289399申请日: 2011-11-04
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公开(公告)号: US08493683B2公开(公告)日: 2013-07-23
- 发明人: Chiu ming Lueng , Mankit Lee , Cheukwing Leung , Ju ren Ding , Rong kwang Ni
- 申请人: Chiu ming Lueng , Mankit Lee , Cheukwing Leung , Ju ren Ding , Rong kwang Ni
- 申请人地址: CN Hong Kong
- 专利权人: SAE Magnetics (H.K.) Ltd.
- 当前专利权人: SAE Magnetics (H.K.) Ltd.
- 当前专利权人地址: CN Hong Kong
- 代理机构: Nixon & Vanderhye PC
- 主分类号: G11B21/02
- IPC分类号: G11B21/02 ; G01R33/12
摘要:
Measuring method of a magnetic head includes (a) placing the magnetic head at normal position, defining a first direction parallel to an air bearing surface and two shielding layers of the magnetic head, and defining a second direction perpendicular to the first direction; (b) tilting the magnetic head at an angle to the second direction, applying a plurality of first magnetic fields with different intensities in the first direction, and measuring out a first output parameter curve; (c) repeating the step (b) with different angles and measuring out a plurality of first output parameter curves; (d) calculating a plurality of pinned direction tilt ratios that a pinned direction of a pinned layer of the magnetic head tilts towards the second direction according to the parameter curves; and (e) calculating a pinned direction tilt angle that the pinned direction tilts towards the second direction according to the pinned direction tilting ratios.
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