发明授权
US08502227B2 Active matrix substrate, display device, method for inspecting the active matrix substrate, and method for inspecting the display device 有权
有源矩阵基板,显示装置,有源矩阵基板的检查方法以及检查显示装置的方法

Active matrix substrate, display device, method for inspecting the active matrix substrate, and method for inspecting the display device
摘要:
An active matrix substrate (2) is provided with first connecting wirings (641, 643, 645, 647) connected to gate terminals (51) to which extraction wirings (611, 613, 615, 617) are connected, second connecting wirings (642, 644, 646) connected to gate terminals (51) to which extraction wirings (612, 614, 616) are connected, bundled wirings (651 to 654) each composed of a mutually adjacent first connecting wiring and second connecting wiring bunched together, a first inspection wiring (66) capable of inputting an inspection signal to bunched wirings (652, 654) that are not adjacent to each other among the bundled wirings, and a second inspection wiring (67) capable of inputting an inspection signal to bundled wirings (651, 653) that are not adjacent to each other and not connected to the first inspection wiring (66) among the bundled wirings.
信息查询
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