摘要:
An active matrix substrate (2) is provided with first connecting wirings (641, 643, 645, 647) connected to gate terminals (51) to which extraction wirings (611, 613, 615, 617) are connected, second connecting wirings (642, 644, 646) connected to gate terminals (51) to which extraction wirings (612, 614, 616) are connected, bundled wirings (651 to 654) each composed of a mutually adjacent first connecting wiring and second connecting wiring bunched together, a first inspection wiring (66) capable of inputting an inspection signal to bunched wirings (652, 654) that are not adjacent to each other among the bundled wirings, and a second inspection wiring (67) capable of inputting an inspection signal to bundled wirings (651, 653) that are not adjacent to each other and not connected to the first inspection wiring (66) among the bundled wirings.
摘要:
An active matrix substrate (2) is provided with first connecting wirings (641, 643, 645, 647) connected to gate terminals (51) to which extraction wirings (611, 613, 615, 617) are connected, second connecting wirings (642, 644, 646) connected to gate terminals (51) to which extraction wirings (612, 614, 616) are connected, bundled wirings (651 to 654) each composed of a mutually adjacent first connecting wiring and second connecting wiring bunched together, a first inspection wiring (66) capable of inputting an inspection signal to bunched wirings (652, 654) that are not adjacent to each other among the bundled wirings, and a second inspection wiring (67) capable of inputting an inspection signal to bundled wirings (651, 653) that are not adjacent to each other and not connected to the first inspection wiring (66) among the bundled wirings.
摘要:
Provided is an active matrix substrate having improved display quality without forming an inspection line in a terminal arrangement region for inspecting short circuit between connection lines. Scanning lines (40) include first scanning lines having input ends for a scanning signal on one end side, and second scanning lines having input ends for a scanning signal the other end side. In a display region (4), the first scanning lines and the second scanning lines are formed alternately one by one. An active matrix substrate (2) includes a first inspection line (70) and a second inspection line (72) that cross each of a plurality of first connection lines (61), and a third inspection line (75) and a fourth inspection line (77) that cross each of a plurality of second connection lines (64). The first to the fourth inspection lines (70, 72, 75, 77) are formed in a frame-shaped wiring region (6), excluding the terminal arrangement region (5) and the display region (4).
摘要:
An active matrix substrate is provided with first inspection wirings (70, 75) capable of inputting inspection signals to first switching wirings that are not adjacent to each other among the first switching wirings (69, 74) and to second switching wirings that are not adjacent to each other among the second switching wirings (69, 74), and second inspection wirings (72, 77) capable of inputting inspection signals to first switching wirings that are not adjacent to each other and not connected to the first inspection wirings among the first switching wirings (69, 74) and to second switching wirings that are not adjacent to each other and not connected to the first inspection wirings among the second switching wirings (69, 74).
摘要:
An active matrix substrate is provided with first inspection wirings (70, 75) capable of inputting inspection signals to first switching wirings that are not adjacent to each other among the first switching wirings (69, 74) and to second switching wirings that are not adjacent to each other among the second switching wirings (69, 74), and second inspection wirings (72, 77) capable of inputting inspection signals to first switching wirings that are not adjacent to each other and not connected to the first inspection wirings among the first switching wirings (69, 74) and to second switching wirings that are not adjacent to each other and not connected to the first inspection wirings among the second switching wirings (69, 74).
摘要:
Provided is an active matrix substrate having improved display quality without forming an inspection line in a terminal arrangement region for inspecting short circuit between connection lines. Scanning lines (40) include first scanning lines having input ends for a scanning signal on one end side, and second scanning lines having input ends for a scanning signal the other end side. In a display region (4), the first scanning lines and the second scanning lines are formed alternately one by one. An active matrix substrate (2) includes a first inspection line (70) and a second inspection line (72) that cross each of a plurality of first connection lines (61), and a third inspection line (75) and a fourth inspection line (77) that cross each of a plurality of second connection lines (64). The first to the fourth inspection lines (70, 72, 75, 77) are formed in a frame-shaped wiring region (6), excluding the terminal arrangement region (5) and the display region (4).
摘要:
Each of picture elements (14) has a plurality of alignment regions (R1, R2, R3, and R4), in each of which liquid crystal molecules contained in a liquid crystal layer are aligned in a direction that is different from those in the others of the plurality of alignment regions. Each of a plurality of scanning signal lines (32) and a border region (R11 and R12) between corresponding adjacent ones of the plurality of alignment regions (R1, R2, R3, and R4) at least partially overlap each other when viewed from above.
摘要:
Each of picture elements (14) has a plurality of alignment regions (R1, R2, R3, and R4), in each of which liquid crystal molecules contained in a liquid crystal layer are aligned in a direction that is different from those in the others of the plurality of alignment regions. Each of a plurality of scanning signal lines (32) and a border region (R11 and R12) between corresponding adjacent ones of the plurality of alignment regions (R1, R2, R3, and R4) at least partially overlap each other when viewed from above.
摘要:
An active matrix substrate (5) provided with a plurality of scan lines (G) and a plurality of data lines (Sr, Sg, Sb) arranged in a matrix, in which first, second, and third short bars (31r, 31b, 31g) are connected to the respective data lines (Sr, Sg, Sb), and, among the first, second, and third short bars, the second short bar (31b) in the middle is provided in a different layer from the first and third short bars (31r, 31g) which are positioned on the sides of the second short bar (31b).
摘要:
There is provided a hot-dip Al—Zn coated steel sheet that has a steel sheet containing Si and Mn as a base steel sheet and has excellent coating appearance and corrosion resistance. The Al—Zn coating layer has an Al content in the range of 20% to 95% by mass. The Al—Zn coating layer has a Ca content in the range of 0.01% to 10% by mass. Alternatively, the Ca and Mg content is in the range of 0.01% to 10% by mass. A steel sheet surface layer within 100 μm from a surface of the base steel sheet directly under the Al—Zn coating layer contains 0.06 to 1.0 g/m2 per surface of an oxide of at least one selected from Fe, Si, Mn, Al, P, B, Nb, Ti, Cr, Mo, Cu, and Ni in total.
摘要翻译:提供了一种热浸镀铝锌钢板,其具有含有Si和Mn作为基础钢板的钢板,并且具有优异的涂层外观和耐腐蚀性。 Al-Zn涂层的Al含量在20质量%至95质量%的范围内。 Al-Zn系涂层的Ca含量为0.01质量%〜10质量%。 或者,Ca和Mg含量在0.01质量%至10质量%的范围内。 在从Al-Zn被覆层的正下方的基材钢板的表面100μm以下的钢板表面层,含有选自Fe,Si,Mn,Al中的至少一种以上的氧化物的表面0.06〜1.0g / m 2, P,B,Nb,Ti,Cr,Mo,Cu和Ni。