Invention Grant
US08510073B2 Real-time adaptive hybrid BiST solution for low-cost and low-resource ate production testing of analog-to-digital converters
失效
实时自适应混合BiST解决方案，用于模拟 - 数字转换器的低成本和低资源生产测试
- Patent Title: Real-time adaptive hybrid BiST solution for low-cost and low-resource ate production testing of analog-to-digital converters
- Patent Title (中): 实时自适应混合BiST解决方案，用于模拟 - 数字转换器的低成本和低资源生产测试
-
Application No.: US12957277Application Date: 2010-11-30
-
Publication No.: US08510073B2Publication Date: 2013-08-13
- Inventor: Sachin D. Dasnurkar
- Applicant: Sachin D. Dasnurkar
- Applicant Address: US CA San Diego
- Assignee: QUALCOMM, Incorporated
- Current Assignee: QUALCOMM, Incorporated
- Current Assignee Address: US CA San Diego
- Agent William M. Hooks
- Main IPC: H03M1/10
- IPC: H03M1/10
Abstract:
An integrated circuit configured to perform hybrid built in self test (BiST) of analog-to-digital converters (ADCs) is described. The integrated circuit includes an ADC. The integrated circuit also includes a BiST controller that controls the hybrid BiST. The integrated circuit further includes a ramp generator that provides a voltage ramp to the ADC. The integrated circuit also includes a first multiplexer that switches an input for the ADC between the voltage ramp and a voltage reference signal. The integrated circuit further includes feedback circuitry for the ramp generator that maintains a constant ramp slope for the ramp generator. The integrated circuit also includes an interval counter that provides a timing reference.
Public/Granted literature
Information query
