发明授权
- 专利标题: Multi-step release method for electrochemically fabricated structures
- 专利标题(中): 电化学制造结构的多步释放方法
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申请号: US12892734申请日: 2010-09-28
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公开(公告)号: US08512578B2公开(公告)日: 2013-08-20
- 发明人: Adam L. Cohen , Michael S. Lockard , Dale S. McPherson
- 申请人: Adam L. Cohen , Michael S. Lockard , Dale S. McPherson
- 申请人地址: US CA Van Nuys
- 专利权人: Microfabrica Inc.
- 当前专利权人: Microfabrica Inc.
- 当前专利权人地址: US CA Van Nuys
- 代理商 Dennis R. Smalley
- 主分类号: C25D5/02
- IPC分类号: C25D5/02 ; B81C1/00
摘要:
Multi-layer structures are electrochemically fabricated from at least one structural material (e.g. nickel), that is configured to define a desired structure and which may be attached to a substrate, and from at least one sacrificial material (e.g. copper) that surrounds the desired structure. After structure formation, the sacrificial material is removed by a multi-stage etching operation. In some embodiments sacrificial material to be removed may be located within passages or the like on a substrate or within an add-on component. The multi-stage etching operations may be separated by intermediate post processing activities, they may be separated by cleaning operations, or barrier material removal operations, or the like. Barriers may be fixed in position by contact with structural material or with a substrate or they may be solely fixed in position by sacrificial material and are thus free to be removed after all retaining sacrificial material is etched.
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