Invention Grant
- Patent Title: Impedance detection circuit and adjustment method of impedance detection circuit
- Patent Title (中): 阻抗检测电路和阻抗检测电路的调整方法
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Application No.: US13104601Application Date: 2011-05-10
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Publication No.: US08525529B2Publication Date: 2013-09-03
- Inventor: Yoshiaki Ishizeki , Jou Kudou , Hiroaki Shirai
- Applicant: Yoshiaki Ishizeki , Jou Kudou , Hiroaki Shirai
- Applicant Address: JP Kanagawa
- Assignee: Renesas Electronics Corporation
- Current Assignee: Renesas Electronics Corporation
- Current Assignee Address: JP Kanagawa
- Agency: Young & Thompson
- Priority: JP2010-117307 20100521
- Main IPC: G01R27/26
- IPC: G01R27/26

Abstract:
According to the present invention, a small impedance detection circuit capable of accurately detecting the impedance of an object to be measured and an adjustment method of an impedance detection circuit can be provided. In the impedance detection circuit according to the present invention, an AC signal generator outputs an AC signal. A detection circuit, which is connected to a circuit to be measured, applies an AC signal to the circuit to be measured. Further, the detection circuit outputs a first signal corresponding to the composite impedance of the impedance of the circuit to be measured and a parasitic impedance. A correction circuit outputs a second signal in synchronization with the first signal. A subtraction circuit outputs a detection signal obtained by subtracting the second signal from the first signal.
Public/Granted literature
- US20110285407A1 IMPEDANCE DETECTION CIRCUIT AND ADJUSTMENT METHOD OF IMPEDANCE DETECTION CIRCUIT Public/Granted day:2011-11-24
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