Invention Grant
- Patent Title: Light emitting component measuring system and the method thereof
- Patent Title (中): 发光元件测量系统及其方法
-
Application No.: US13245088Application Date: 2011-09-26
-
Publication No.: US08525996B2Publication Date: 2013-09-03
- Inventor: Hsu-Ting Cheng , I-Shih Tseng , Tsun-I Wang
- Applicant: Hsu-Ting Cheng , I-Shih Tseng , Tsun-I Wang
- Applicant Address: TW Taoyuan Hsien
- Assignee: Chroma Ate Inc.
- Current Assignee: Chroma Ate Inc.
- Current Assignee Address: TW Taoyuan Hsien
- Agency: Thomas|Horstemeyer, LLP
- Priority: TW100112917A 20110414
- Main IPC: G01N21/25
- IPC: G01N21/25

Abstract:
The invention discloses a light emitting component measuring system and the method thereof which is capable of measuring the optical proprieties of a plurality of the devices under test (DUT). Each DUT is capable of receiving electricity so as to output an initial ray, wherein each initial ray has a first wavelength range. The light emitting component measuring system comprises a filtering device and a sensing device. The filtering device comprises a first filtering portion which can filter a corresponding third wavelength of the said initial rays and output a plurality of first filtered rays simultaneously. Each first filtered ray has a second wavelength range respectively. The said sensing device receives the ray outputted from the filtering device and generates an optical data accordingly.
Public/Granted literature
- US20120250021A1 Light Emitting Component Measuring System and The Method Thereof Public/Granted day:2012-10-04
Information query