公开(公告)号：US08525996B2

公开(公告)日：2013-09-03

申请号：US13245088

申请日：2011-09-26

申请人： Hsu-Ting Cheng ,  I-Shih Tseng ,  Tsun-I Wang

发明人： Hsu-Ting Cheng ,  I-Shih Tseng ,  Tsun-I Wang

IPC分类号： G01N21/25

CPC分类号： G01J3/51 ,  G01J2001/4252 ,  G01J2005/608 ,  G01R31/2635

摘要： The invention discloses a light emitting component measuring system and the method thereof which is capable of measuring the optical proprieties of a plurality of the devices under test (DUT). Each DUT is capable of receiving electricity so as to output an initial ray, wherein each initial ray has a first wavelength range. The light emitting component measuring system comprises a filtering device and a sensing device. The filtering device comprises a first filtering portion which can filter a corresponding third wavelength of the said initial rays and output a plurality of first filtered rays simultaneously. Each first filtered ray has a second wavelength range respectively. The said sensing device receives the ray outputted from the filtering device and generates an optical data accordingly.

摘要翻译： 本发明公开了一种发光元件测量系统及其方法，其能够测量被测器件（DUT）的多个测试光学特性。 每个DUT能够接收电力以输出初始射线，其中每个初始射线具有第一波长范围。 发光元件测量系统包括过滤装置和感测装置。 滤波装置包括第一滤波部分，其可以过滤所述初始光线的相应的第三波长并同时输出多个第一滤波光线。 每个第一滤波光线分别具有第二波长范围。 所述感测装置接收从过滤装置输出的射线，并相应地产生光学数据。

公开(公告)号：US06925415B2

公开(公告)日：2005-08-02

申请号：US10374441

申请日：2003-02-25

申请人： I-Shih Tseng ,  Chau-Chin Su ,  Wei-Juo Wang

发明人： I-Shih Tseng ,  Chau-Chin Su ,  Wei-Juo Wang

IPC分类号： G09G3/00 ,  G06F17/18 ,  G06F15/00

CPC分类号： G09G3/006

摘要： A measuring method and system for liquid crystal display driver chips applies a new method to measure voltages of driver chips, and utilizes probability and statistics for analysis and determination so as to yield a rather accurate effect even under noisy environments. Accordingly, analog-to-digital converters can be replaced for faster sampling. The measuring method and system can be implemented using comparator circuits or pin electronics cards so that the measuring procedure for driver chips is simplified. Measured results are analyzed and verified by application of probability and statistics. As such, testing of liquid crystal display driver chips is more accurate, testing time is reduced, and accuracy level is promoted.

摘要翻译： 液晶显示驱动芯片的测量方法和系统应用了一种测量驱动芯片电压的新方法，并利用概率统计学进行分析和确定，即使在嘈杂的环境下也能产生相当准确的效果。 因此，可以替换模数转换器以进行更快的采样。 测量方法和系统可以使用比较器电路或引脚电子卡来实现，从而简化驱动器芯片的测量程序。 通过应用概率和统计量对测量结果进行分析和验证。 因此，液晶显示驱动器芯片的测试更准确，测试时间缩短，提高了精度水平。

公开(公告)号：US20090309606A1

公开(公告)日：2009-12-17

申请号：US12429578

申请日：2009-04-24

申请人： I-SHIH TSENG ,  JEFF LEE ,  MIN-HUNG CHANG

发明人： I-SHIH TSENG ,  JEFF LEE ,  MIN-HUNG CHANG

IPC分类号： G01R31/00

CPC分类号： G01J1/4228 ,  G01J1/02 ,  G01J1/0223 ,  G01J2001/0481 ,  G01J2001/4247 ,  G01R31/01 ,  G01R31/2635

摘要： A method for testing light-emitting devices in a batch-wise, associated with a system for the same purpose, comprises the steps of: preparing the light-emitting devices on a moving carrier unit in a manner of aligning a predetermined longitudinal direction of the light-emitting devices with a predetermined transportation direction of the moving carrier unit, each of the light-emitting devices further having plural light-emitting elements; transporting orderly the light-emitting devices to pass a test area on a base of the system, in which the base energizes only the light-emitting elements within the test area; and, a solar cell module detecting continuously the energized light-emitting elements within the test area and further forming signals with respect to photo energy received in the test area.

摘要翻译： 用于同样目的的与系统相关联地测试发光器件的方法包括以下步骤：将移动的载体单元上的发光器件以对准预定的纵向方向的方式 具有预定的移动载体单元的输送方向的发光装置，每个发光装置还具有多个发光元件; 传输有序的发光器件，以通过系统底座上的测试区域，其中基极仅激励测试区域内的发光元件; 以及太阳能电池模块，连续地检测测试区域内的激发的发光元件，并进一步形成关于在测试区域中接收的光能的信号。

公开(公告)号：US20120320369A1

公开(公告)日：2012-12-20

申请号：US13252425

申请日：2011-10-04

申请人： Hsu-Ting Cheng ,  I-Shih Tseng ,  Tsun-I Wang

发明人： Hsu-Ting Cheng ,  I-Shih Tseng ,  Tsun-I Wang

IPC分类号： G01J1/42 ,  G01J3/28 ,  G01N21/17

CPC分类号： G01J3/0205 ,  G01J3/0216 ,  G01J3/024 ,  G01J3/505 ,  G01J2001/4247

摘要： The invention discloses an optical measurement system for measuring the optical properties of a device under test (DUT). The optical measurement system includes a DUT, a light measuring module, a light guiding module and an analyzing module. The present invention utilizes the light guiding module to receive an axial ray of the rays emitted by the DUT so as to analyze the optical properties thereof. Thus, the present invention is not only capable of measuring the light intensity of the rays emitted by the DUT, but also capable of obtaining the properties of the axial ray emitted by the DUT.

摘要翻译： 本发明公开了一种用于测量待测器件（DUT）的光学特性的光学测量系统。 光学测量系统包括DUT，光测量模块，导光模块和分析模块。 本发明利用光导模块来接收由DUT发射的射线的轴向光线，以分析其光学特性。 因此，本发明不仅能够测量由DUT发射的光线的光强度，而且能够获得由DUT发射的轴向射线的特性。

公开(公告)号：US20080266797A1

公开(公告)日：2008-10-30

申请号：US11982658

申请日：2007-11-01

申请人： I-Shih Tseng

发明人： I-Shih Tseng

IPC分类号： H05K7/20

CPC分类号： H01L23/467 ,  G06F1/20 ,  H01L2924/0002 ,  H01L2924/00

摘要： It's a type of top mount surface airflow heatsink, utilizing the upper ceiling wall separated by an air gap, working together with the upper surface of a heating device (microprocessor) producing an air current. It's a simple device, with a low cost using the Reynolds Equation Re=(ρumd)/μ≧2,500; with ρ being the fluid density, um being the free-stream fluid velocity, d being the pipe distance or diameter, μ being the fluid viscosity. Since the airflow produces air turbulence, it causes the frequent heat exchanges in the air. It also causes the obvious temperature changes within the different layers of air. Therefore, it increases tremendously, the efficiency of dissipating the heat. It requires only the input of the air. The operation is simple and it allows the usage of even higher heat generating devices. Thus it promotes the alternative usage of this top mount heatsink device within the installation of circuit board components.

摘要翻译： 它是一种顶部安装表面气流散热器，利用由气隙隔开的上部顶壁，与加热装置（微处理器）的上表面一起产生气流。 这是一个简单的设备，使用雷诺方程Re =（rhou m> d）/ mu = 2500; 其中rho是流体密度，u> m是自由流体流速，d是管道距离或直径，μ是流体粘度。 由于气流产生空气湍流，导致空气中频繁的热交换。 它也会导致不同层次空气中明显的温度变化。 因此，它大大增加了散热的效率。 它只需要空气的输入。 操作简单，可以使用更高的发热装置。 因此，它可以在电路板组件的安装中促进该顶部安装散热装置的替代使用。

公开(公告)号：US06304119B1

公开(公告)日：2001-10-16

申请号：US09748926

申请日：2000-12-27

申请人： Huan-Ming Tseng ,  I-Shih Tseng ,  Chau-Chin Su ,  Chih-Hung Lin ,  Chun-Min Yang

发明人： Huan-Ming Tseng ,  I-Shih Tseng ,  Chau-Chin Su ,  Chih-Hung Lin ,  Chun-Min Yang

IPC分类号： H03L700

CPC分类号： H03L7/0805 ,  G01R31/3191 ,  G01R31/31922 ,  H03L7/07 ,  H03L7/0812

摘要： A timing generating apparatus includes a master timing module adapted to receive an external reference clock and to generate a coarse timing pulse signal. A slave timing module is coupled electrically to the master timing module and receives the coarse timing pulse signal, from which a fine timing pulse signal is generated. A calibration module coupled electrically to the master timing module and the slave timing module receives the coarse timing pulse signal and the fine timing pulse signal, determines a phase difference value between the two, and generates a phase compensation signal corresponding to difference between the phase difference value and a predetermined phase difference value. The slave timing module includes a delay control unit and a voltage-controlled delay unit, which introduce a phase delay into the coarse timing pulse signal so as to generate the fine timing pulse signal.

摘要翻译： 定时产生装置包括适于接收外部参考时钟并产生粗定时脉冲信号的主定时模块。 从时序模块电耦合到主定时模块，并接收粗定时脉冲信号，从而产生精细定时脉冲信号。 与主定时模块和从定时模块电连接的校准模块接收粗定时脉冲信号和精细定时脉冲信号，确定两者之间的相位差值，并产生对应于相位差之间的差的相位补偿信号 值和预定的相位差值。 从时序模块包括延迟控制单元和压控延迟单元，其将相位延迟引入到粗定时脉冲信号中，以产生精细定时脉冲信号。

公开(公告)号：US20130015859A1

公开(公告)日：2013-01-17

申请号：US13299443

申请日：2011-11-18

申请人： I-Shih Tseng ,  Tien-Teng Chang ,  Jeff Lee ,  Chih-Yu Cheng ,  Hsu-Ting Cheng

发明人： I-Shih Tseng ,  Tien-Teng Chang ,  Jeff Lee ,  Chih-Yu Cheng ,  Hsu-Ting Cheng

IPC分类号： G01R31/26

CPC分类号： G01R31/2635 ,  G01R1/0408

摘要： A testing apparatus for flip chip LEDs includes a transparent substrate, a spacing member, a flexible transparent carrier, and a vacuum generator. The spacing member is configured on a first surface of the transparent substrate. The flexible transparent carrier is removably assembled to the spacing member so that a closed space is formed by the flexible transparent carrier, the spacing member, and the first surface of the transparent substrate. The vacuum generator is connected to the closed space for pumping air out of the closed space, and then a part of the transparent substrate clings to the first surface to form a testing area for loading the flip chip LED.

摘要翻译： 倒装芯片LED的测试装置包括透明衬底，间隔构件，柔性透明载体和真空发生器。 间隔部件构造在透明基板的第一面上。 柔性透明载体可移除地组装到间隔构件，使得由柔性透明载体，间隔构件和透明基底的第一表面形成封闭空间。 真空发生器连接到封闭空间，用于将空气排出封闭空间，然后一部分透明基板粘附到第一表面，形成用于装载倒装芯片LED的测试区域。

公开(公告)号：US20120250021A1

公开(公告)日：2012-10-04

申请号：US13245088

申请日：2011-09-26

申请人： Hsu-Ting Cheng ,  I-Shih Tseng ,  Tsun-I Wang

发明人： Hsu-Ting Cheng ,  I-Shih Tseng ,  Tsun-I Wang

IPC分类号： G01N21/27

CPC分类号： G01J3/51 ,  G01J2001/4252 ,  G01J2005/608 ,  G01R31/2635

摘要： The invention discloses a light emitting component measuring system and the method thereof which is capable of measuring the optical proprieties of a plurality of the devices under test (DUT). Each DUT is capable of receiving electricity so as to output an initial ray, wherein each initial ray has a first wavelength range. The light emitting component measuring system comprises a filtering device and a sensing device. The filtering device comprises a first filtering portion which can filter a corresponding third wavelength of the said initial rays and output a plurality of first filtered rays simultaneously. Each first filtered ray has a second wavelength range respectively. The said sensing device receives the ray outputted from the filtering device and generates an optical data accordingly.

摘要翻译： 本发明公开了一种发光元件测量系统及其方法，其能够测量被测器件（DUT）的多个测试光学特性。 每个DUT能够接收电力以输出初始射线，其中每个初始射线具有第一波长范围。 发光元件测量系统包括过滤装置和感测装置。 滤波装置包括第一滤波部分，其可以过滤所述初始光线的对应的第三波长并同时输出多个第一滤波光线。 每个第一滤波光线分别具有第二波长范围。 所述感测装置接收从过滤装置输出的射线，并相应地产生光学数据。

公开(公告)号：US09429617B2

公开(公告)日：2016-08-30

申请号：US13299443

申请日：2011-11-18

申请人： I-Shih Tseng ,  Tien-Teng Chang ,  Jeff Lee ,  Chih-Yu Cheng ,  Hsu-Ting Cheng

发明人： I-Shih Tseng ,  Tien-Teng Chang ,  Jeff Lee ,  Chih-Yu Cheng ,  Hsu-Ting Cheng

IPC分类号： G01R31/26 ,  G01R1/04

CPC分类号： G01R31/2635 ,  G01R1/0408

摘要： A testing apparatus for flip chip LEDs includes a transparent substrate, a spacing member, a flexible transparent carrier, and a vacuum generator. The spacing member is configured on a first surface of the transparent substrate. The flexible transparent carrier is removably assembled to the spacing member so that a closed space is formed by the flexible transparent carrier, the spacing member, and the first surface of the transparent substrate. The vacuum generator is connected to the closed space for pumping air out of the closed space, and then a part of the transparent substrate clings to the first surface to form a testing area for loading the flip chip LED.

摘要翻译： 倒装芯片LED的测试装置包括透明衬底，间隔构件，柔性透明载体和真空发生器。 间隔部件构造在透明基板的第一面上。 柔性透明载体可移除地组装到间隔构件，使得由柔性透明载体，间隔构件和透明基底的第一表面形成封闭空间。 真空发生器连接到封闭空间，用于将空气排出封闭空间，然后一部分透明基板粘附到第一表面，形成用于装载倒装芯片LED的测试区域。

公开(公告)号：US07804589B2

公开(公告)日：2010-09-28

申请号：US12429578

申请日：2009-04-24

申请人： I-Shih Tseng ,  Jeff Lee ,  Min-Hung Chang

发明人： I-Shih Tseng ,  Jeff Lee ,  Min-Hung Chang

IPC分类号： G01J1/00 ,  H01J3/14 ,  H01J40/14

CPC分类号： G01J1/4228 ,  G01J1/02 ,  G01J1/0223 ,  G01J2001/0481 ,  G01J2001/4247 ,  G01R31/01 ,  G01R31/2635

摘要： A method for testing light-emitting devices in a batch-wise, associated with a system for the same purpose, comprises the steps of: preparing the light-emitting devices on a moving carrier unit in a manner of aligning a predetermined longitudinal direction of the light-emitting devices with a predetermined transportation direction of the moving carrier unit, each of the light-emitting devices further having plural light-emitting elements; transporting orderly the light-emitting devices to pass a test area on a base of the system, in which the base energizes only the light-emitting elements within the test area; and, a solar cell module detecting continuously the energized light-emitting elements within the test area and further forming signals with respect to photo energy received in the test area.

摘要翻译： 用于同样目的的与系统相关联地测试发光器件的方法包括以下步骤：将移动的载体单元上的发光器件以对准预定的纵向方向的方式 具有预定的移动载体单元的输送方向的发光装置，每个发光装置还具有多个发光元件; 传输有序的发光器件，以通过系统底座上的测试区域，其中基极仅激励测试区域内的发光元件; 以及太阳能电池模块，连续地检测测试区域内的激发的发光元件，并进一步形成关于在测试区域中接收的光能的信号。