Invention Grant
- Patent Title: Compensated MEMS FTIR spectrometer architecture
- Patent Title (中): 补偿MEMS FTIR光谱仪架构
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Application No.: US12877888Application Date: 2010-09-08
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Publication No.: US08531675B2Publication Date: 2013-09-10
- Inventor: Diaa A. Khalil , Bassem Mortada , Mohamed Nabil , Mostafa Medhat , Bassam A. Saadany
- Applicant: Diaa A. Khalil , Bassem Mortada , Mohamed Nabil , Mostafa Medhat , Bassam A. Saadany
- Applicant Address: EG Cairo
- Assignee: Si-Ware Systems, Inc.
- Current Assignee: Si-Ware Systems, Inc.
- Current Assignee Address: EG Cairo
- Agency: Garlick & Markison
- Agent Holly L. Rudnick
- Main IPC: G01B9/02
- IPC: G01B9/02

Abstract:
A Micro Electro-Mechanical System (MEMS) spectrometer architecture compensates for verticality and dispersion problems using balancing interfaces. A MEMS spectrometer/interferometer includes a beam splitter formed on a first surface of a first medium at an interface between the first medium and a second medium, a first mirror formed on a second surface of the first medium, a second mirror formed on a third surface of the first medium and balancing interfaces designed to minimize both a difference in tilt angles between the surfaces and a difference in phase errors between beams reflected from the first and second mirrors.
Public/Granted literature
- US20110058180A1 Compensated MEMS FTIR Spectrometer Architecture Public/Granted day:2011-03-10
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