Invention Grant
- Patent Title: High-linearity testing stimulus signal generator
- Patent Title (中): 高线性测试刺激信号发生器
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Application No.: US13092531Application Date: 2011-04-22
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Publication No.: US08542053B2Publication Date: 2013-09-24
- Inventor: Chun-Wei Lin , Yi-Cang Wu
- Applicant: Chun-Wei Lin , Yi-Cang Wu
- Applicant Address: TW Yunlin County
- Assignee: National Yunlin University of Science and Technology
- Current Assignee: National Yunlin University of Science and Technology
- Current Assignee Address: TW Yunlin County
- Agency: Muncy, Geissler, Olds & Lowe, PLLC
- Main IPC: G06G7/12
- IPC: G06G7/12

Abstract:
A high-linearity testing stimulus signal generator comprises a signal collection unit receiving an input current signal, a waveform conversion unit connecting with the signal collection unit, a first voltage-to-current conversion unit connecting with the waveform conversion unit, a delay unit connecting with the waveform conversion unit, a second voltage-to-current conversion unit connecting with the delay unit, a current comparison unit connecting respectively with the first voltage-to-current conversion unit and the second voltage-to-current conversion unit, an error calculation unit connecting with the current comparison unit, and a compensation unit connecting with the error calculation unit. The above-mentioned structure forms a feedback mechanism to perform compensation adjustment to promote the linearity of the output signals. Thus, the present invention can generate high-accuracy testing stimulus signals.
Public/Granted literature
- US20120268192A1 HIGH-LINEARITY TESTING STIMULUS SIGNAL GENERATOR Public/Granted day:2012-10-25
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