发明授权
US08551575B1 Methods and solutions for preventing the formation of metal particulate defect matter upon a substrate after a plating process
有权
用于防止在电镀工艺之后在基板上形成金属颗粒缺陷物质的方法和解决方案
- 专利标题: Methods and solutions for preventing the formation of metal particulate defect matter upon a substrate after a plating process
- 专利标题(中): 用于防止在电镀工艺之后在基板上形成金属颗粒缺陷物质的方法和解决方案
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申请号: US13401244申请日: 2012-02-21
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公开(公告)号: US08551575B1公开(公告)日: 2013-10-08
- 发明人: Shijian Li , Artur K. Kolics , Tiruchirapalli N. Arunagiri
- 申请人: Shijian Li , Artur K. Kolics , Tiruchirapalli N. Arunagiri
- 申请人地址: US CA Fremont
- 专利权人: Lam Research
- 当前专利权人: Lam Research
- 当前专利权人地址: US CA Fremont
- 代理机构: Daffer McDaniel LLP
- 代理商 Kevin L. Daffer; Mollie E. Lettang
- 主分类号: C23C18/16
- IPC分类号: C23C18/16 ; C23C18/50
摘要:
Methods and solutions for preventing the formation of metal particulate defect matter upon a substrate after plating processes are provided. In particular, solutions are provided which are free of oxidizing agents and include a non-metal pH adjusting agent in sufficient concentration such that the solution has a pH between approximately 7.5 and approximately 12.0. In some cases, a solution may include a chelating agent. In addition or alternatively, a solution may include at least two different types of complexing agents each offering a single point of attachment for binding metal ions via respectively different functional groups. In any case, at least one of the complexing agents or the chelating agent includes a non-amine or non-imine functional group. An embodiment of a method for processing a substrate includes plating a metal layer upon the substrate and subsequently exposing the substrate to a solution comprising the aforementioned make-up.
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